发明授权
- 专利标题： Apparatus and methods for assessing reliability of assemblies using programmable logic devices
- 专利标题（中）： 使用可编程逻辑器件评估组件可靠性的装置和方法
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申请号： US10465139申请日： 2003-06-19
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公开(公告)号： US07210081B1公开(公告)日： 2007-04-24
- 发明人: Bruce Euzent , Roy Wei-Guang Wu , Jeffrey Barton , Anil Pannikkat , Vadali Mahadev , Tomas Jonsson
- 申请人： Bruce Euzent , Roy Wei-Guang Wu , Jeffrey Barton , Anil Pannikkat , Vadali Mahadev , Tomas Jonsson
- 申请人地址： US CA San Jose
- 专利权人： Altera Corporation
- 当前专利权人： Altera Corporation
- 当前专利权人地址： US CA San Jose
- 代理机构： Law Offices of Maximilian R. Peterson
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
An apparatus performs reliability assessment of electronic hardware. The apparatus includes a test assembly. The test assembly includes at least one programmable logic device (PLD). The PLD is configured to provide a logic function, such as the function of a plurality of inverters coupled in a cascade manner. The apparatus further includes a signal source coupled to the test assembly. The signal source provides a stimulus signal to the test assembly. The apparatus also includes a signal monitor coupled to the test assembly. The signal monitor monitors a response signal generated by the test assembly.
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