Invention Grant
- Patent Title: Method and arrangement for microscopy
- Patent Title (中): 显微镜的方法和布置
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Application No.: US10604314Application Date: 2003-07-10
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Publication No.: US07221784B2Publication Date: 2007-05-22
- Inventor: Frank Olschewski
- Applicant: Frank Olschewski
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Houston Eliseeva LLP
- Priority: DE10235656 20020802
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method and an arrangement for automatic three-dimensional recording of structures of interest in a sample (15) are disclosed. The arrangement possesses a microscope having at least one microscope objective (13). The images of a sample (15) are acquired using a detector unit (19). A computer system (23) controls acquisition of the images and the microscope functions. The computer system (23) possesses a means (25) for automatically recording the entire marked specimen region in three dimensions.
Public/Granted literature
- US20040109169A1 Method and Arrangement For Microscopy Public/Granted day:2004-06-10
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