- 专利标题: Lithographic apparatus and method for calibrating the same
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申请号: US10899295申请日: 2004-07-27
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公开(公告)号: US07256871B2公开(公告)日: 2007-08-14
- 发明人: Erik Roelof Loopstra , Leon Martin Levasier , Rene Oesterholt
- 申请人: Erik Roelof Loopstra , Leon Martin Levasier , Rene Oesterholt
- 申请人地址: NL Veldhoven
- 专利权人: ASML Netherlands B.V.
- 当前专利权人: ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven
- 代理机构: Pillsbury Winthrop Shaw Pittman LLP
- 主分类号: G03B27/58
- IPC分类号: G03B27/58 ; G03B27/42 ; G03B27/52 ; G03B27/32
摘要:
Lithographic apparatus includes a substrate table and a motion control system for controlling a movement of the substrate table. The motion control system includes at least 3 position detectors constructed for detecting a position of the substrate table. For measuring a position and orientation of the substrate table, each position detector comprises an optical encoder of a single dimensional or multi dimensional type, the optical encoders being arranged for providing together at least 6 position values, at least one position value being provided for each of the 3 dimensions. 3 or more of the at least 3 optical encoders being connected to the substrate table at different locations in the 3 dimensional coordinate system. The motion control system is arranged to calculate the position of the substrate table in the 3 dimensional coordinate system from a subset of at least 3 of the 6 position values and to calculate an orientation of the substrate table with respect to the coordinate system from another subset of at least 3 of the 6 position values. Further, a method for calibrating the position detectors is described.
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