Invention Grant
- Patent Title: System and method for calibrating on-die components
- Patent Title (中): 用于校准模内部件的系统和方法
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Application No.: US11406947Application Date: 2006-04-18
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Publication No.: US07268712B1Publication Date: 2007-09-11
- Inventor: Ruey-Bin Sheen
- Applicant: Ruey-Bin Sheen
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Kirkpatrick & Lockhart Preston Gates Ellis LLP
- Main IPC: H03M1/10
- IPC: H03M1/10
Abstract:
An on-die calibration system includes an external reference component, a first and a second on-die adjustable components, and a calibration module coupled to the reference component, the first and second components, wherein the calibration module calibrates the first component according to the reference component and calibrates the second component according to the calibrated first component.
Information query
