Invention Grant
- Patent Title: Arrayed sensor measurement system and method
- Patent Title (中): 阵列传感器测量系统及方法
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Application No.: US11019439Application Date: 2004-12-21
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Publication No.: US07286221B2Publication Date: 2007-10-23
- Inventor: Stephen J. Caracci , Norman H. Fontaine , Eric J. Mozdy , Po Ki Yuen
- Applicant: Stephen J. Caracci , Norman H. Fontaine , Eric J. Mozdy , Po Ki Yuen
- Applicant Address: US NY Corning
- Assignee: Corning Incorporated
- Current Assignee: Corning Incorporated
- Current Assignee Address: US NY Corning
- Agent William J. Tucker; Thomas R. Beall
- Main IPC: G01J3/00
- IPC: G01J3/00
Abstract:
Optical interrogation systems and methods are described herein that are capable of measuring the angles (or changes in the angles) at which light reflects, transmits, scatters, or is emitted from an array of sensors or specimens that are distributed over a large area 2-dimensional array.
Public/Granted literature
- US20050099622A1 Arrayed sensor measurement system and method Public/Granted day:2005-05-12
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