发明授权
- 专利标题: Full width array mechanically tunable spectrophotometer
- 专利标题(中): 全宽阵列机械可调分光光度计
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申请号: US11016952申请日: 2004-12-20
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公开(公告)号: US07333208B2公开(公告)日: 2008-02-19
- 发明人: Lalit Keshav Mestha , Yao Rong Wang , Joel A. Kubby
- 申请人: Lalit Keshav Mestha , Yao Rong Wang , Joel A. Kubby
- 申请人地址: US CT Norwalk
- 专利权人: Xerox Corporation
- 当前专利权人: Xerox Corporation
- 当前专利权人地址: US CT Norwalk
- 代理机构: Fay Sharpe LLP
- 主分类号: G01J3/45
- IPC分类号: G01J3/45 ; G01B11/02 ; G01B9/02
摘要:
Apparatus and methods are provided for implementing a full width array material scanning spectrophotometer by integrating a Fabry-Perot cavity filter with a silicon photodetector and a light focusing device (an optical guide or a SELFOC® lens). The material to be scanned is illuminated by a broad band illumination source (white LEDs or a fluorescence light source). The Fabry-Perot cavity gap can be tuned electromechanically to get multiple measurements to resolve the spectral distribution of the transmitted light signal. The array spectrophotometric architecture facilitates an elongated, substantially linear band detection and the associated spectral reconstruction technique resolves spectral distribution in the presence of multiple resonant peaks.
公开/授权文献
- US20060132787A1 Full width array mechanically tunable spectrophotometer 公开/授权日:2006-06-22
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