发明授权
- 专利标题: Semiconductor memory device having high electrical performance and mask and photolithography friendliness
- 专利标题(中): 具有高电气性能和掩模和光刻友好性的半导体存储器件
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申请号: US11621617申请日: 2007-01-10
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公开(公告)号: US07375390B2公开(公告)日: 2008-05-20
- 发明人: Jung-Hyeon Lee , Gi-Sung Yeo , Doo-Hoon Goo , Woo-Sung Han
- 申请人: Jung-Hyeon Lee , Gi-Sung Yeo , Doo-Hoon Goo , Woo-Sung Han
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR2003-56712 20030816
- 主分类号: H01L27/108
- IPC分类号: H01L27/108 ; H01L29/76 ; H01L29/94 ; H01L31/119
摘要:
A semiconductor memory device includes a plurality of rows, each row comprising a plurality of active regions arranged at a pitch wherein the active regions in adjacent rows are shifted with respect to each other by one half of the pitch, wherein a distance between each active region in a row is equal to a distance between active regions in adjacent rows.