发明授权
US07394277B2 Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method
有权
测试仪器，测试方法，抖动滤波电路和抖动滤波方法
- 专利标题： Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method
- 专利标题（中）： 测试仪器，测试方法，抖动滤波电路和抖动滤波方法
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申请号： US11407136申请日： 2006-04-20
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公开(公告)号： US07394277B2公开(公告)日： 2008-07-01
- 发明人: Masahiro Ishida , Kiyotaka Ichiyama , Takahiro Yamaguchi
- 申请人： Masahiro Ishida , Kiyotaka Ichiyama , Takahiro Yamaguchi
- 申请人地址： JP Tokyo
- 专利权人： Advantest Corporation
- 当前专利权人： Advantest Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： Sterne, Kessler, Goldstein & Fox P.L.L.C.
- 主分类号： G01R31/26
- IPC分类号： G01R31/26
摘要：
There is provided a testing apparatus for evaluating a device-under-test, having an extracting section for extracting jitter components out of an output signal outputted out of the device-under-test, a filter for passing predetermined frequency components in the jitter components, a phase control section for controlling phase of the output signal based on the jitter components outputted out of the filter and an evaluating section for evaluating the device-under-test based on a signal outputted out of the phase control section.
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