摘要:
There is provided a deterministic component model identifying apparatus for determining a type of a deterministic component contained in a probability density function supplied thereto. The deterministic component model identifying apparatus includes a spectrum calculating section that calculates a spectrum of the probability density function on an axis of a predetermined variable, a null value detecting section that detects a null value on the axis of the predetermined variable in the calculated spectrum, a theoretical value calculating section that calculates a theoretical value of a spectrum of the deterministic component in association with each of a plurality of predetermined deterministic component types, based on the null value detected by the null value detecting section, and a model determining section that determines, as the type of the deterministic component contained in the probability density function, a deterministic component type associated with a logarithmic magnitude spectrum difference most similar to a logarithmic magnitude spectrum of a Gaussian distribution, where the logarithmic magnitude spectrum difference is produced by subtracting the theoretical value of the spectrum of the deterministic component calculated in association with each of the plurality of predetermined deterministic component types from the spectrum calculated by the spectrum calculating section.
摘要:
There is provided a jitter measurement apparatus for measuring a jitter of a data signal having a substantially constant data rate. The jitter measurement apparatus includes therein a signal converting section that converts the data signal into a clock signal, where the clock signal retains timings of data transition edges of the data signal at which a data value of the data signal transits and has edges whose cycle is substantially equal to the data rate, an analytic signal generating section that converts the clock signal into an analytic signal of a complex number, and a jitter measuring section that measures the jitter of the data signal based on the analytic signal.
摘要:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.
摘要:
A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an identical signal to the phase detector as the first input signal and as the second input signal; and a jitter measurement unit for measuring the intrinsic jitter of the circuit to be tested by measuring a jitter of a signal which is generated in an inside of the circuit to be tested according to an signal output from the phase detector.
摘要:
Provided is a deterministic component model determining apparatus that determines a type of a deterministic component included in a probability density function supplied thereto, comprising a standard deviation calculating section that calculates a standard deviation of the probability density function; a spectrum calculating section that calculates a spectrum of the probability density function; a null frequency detecting section that detects a null frequency of the spectrum; a theoretical value calculating section that calculates a theoretical value of a spectrum for each of a plurality of predetermined types of deterministic components, based on the null frequency; a measured value calculating section that calculates a measured value of the spectrum for the deterministic component included in the probability density function, based on the standard deviation and the spectrum; and a model determining section that determines the type of the deterministic component included in the probability density function to be the type of deterministic component corresponding to a theoretical value closest to the measured value, from among the theoretical values for the plurality of types of deterministic components.
摘要:
A jitter measuring apparatus measures timing jitter of a signal-under-test. The jitter measuring apparatus includes a pulse generator for outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, and a jitter measuring sub-unit for extracting the timing jitter on the basis of a duty ratio of each cycle of the signal output by the pulse generator.
摘要:
A deterministic component identifying apparatus identifies a distribution shape of a deterministic component included in a probability density function supplied thereto. The apparatus includes a standard deviation calculating section that calculates a standard deviation of the probability density function, a spectrum calculating section that calculates a spectrum of the probability density function, a null frequency detecting section that detects a null frequency of the spectrum, and a ratio calculating section that calculates a ratio between a top portion and a bottom portion of a distribution of the deterministic component, based on the standard deviation of the probability density function and the null frequency of the spectrum.
摘要:
A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an identical signal to the phase detector as the first input signal and as the second input signal; and a jitter measurement unit for measuring the intrinsic jitter of the circuit to be tested by measuring a jitter of a signal which is generated in an inside of the circuit to be tested according to an signal output from the phase detector.
摘要:
There is provided a calibration apparatus for calibrating an electronic device that outputs a demodulation signal in which a modulated component of a signal to be tested or evaluated is demodulated, having a DC component detecting section for detecting a DC component of the demodulation signal, a gain calculating section for calculating a gain in the electronic device based on the DC component of the demodulation signal and a calibrating section for calibrating the electronic device based on the gain in the electronic device.
摘要:
There is provided a testing apparatus for evaluating a device-under-test, having an extracting section for extracting jitter components out of an output signal outputted out of the device-under-test, a filter for passing predetermined frequency components in the jitter components, a phase control section for controlling phase of the output signal based on the jitter components outputted out of the filter and an evaluating section for evaluating the device-under-test based on a signal outputted out of the phase control section.