发明授权
- 专利标题： Scanning ion probe systems and methods of use thereof
- 专利标题（中）： 扫描离子探针系统及其使用方法
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申请号： US11336137申请日： 2006-01-19
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公开(公告)号： US07442927B2公开(公告)日： 2008-10-28
- 发明人: Andrei G. Fedorov
- 申请人： Andrei G. Fedorov
- 申请人地址： US GA Atlanta
- 专利权人： Georgia Tech Research Corp
- 当前专利权人： Georgia Tech Research Corp
- 当前专利权人地址： US GA Atlanta
- 代理机构： Thomas, Kayden, Horstemeyer & Risley LLP
- 主分类号： G12B21/04
- IPC分类号： G12B21/04 ; G01N13/12
摘要：
Briefly described, embodiments of this disclosure, among others, include scanning ion probe systems, methods of use thereof, scanning ion source systems, methods of use thereof, scanning ion probe mass spectrometry systems, methods of use thereof, methods of simultaneous ion analysis and imaging, and methods of simultaneous mass spectrometry and imaging.
公开/授权文献
- US20070164216A1 Scanning ion probe systems and methods of use thereof 公开/授权日：2007-07-19