发明授权
- 专利标题： Focus-detector arrangement with X-ray optical grating for phase contrast measurement
- 专利标题（中）： 用于相位测量的X射线光栅的聚焦检测器布置
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申请号： US11700173申请日： 2007-01-31
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公开(公告)号： US07453981B2公开(公告)日： 2008-11-18
- 发明人: Joachim Baumann , Martin Engelhardt , Jörg Freudenberger , Eckhard Hempel , Martin Hoheisel , Thomas Mertelmeier , Stefan Popescu , Manfred Schuster
- 申请人： Joachim Baumann , Martin Engelhardt , Jörg Freudenberger , Eckhard Hempel , Martin Hoheisel , Thomas Mertelmeier , Stefan Popescu , Manfred Schuster
- 申请人地址： DE Munich
- 专利权人： Siemens Aktiengesellschaft
- 当前专利权人： Siemens Aktiengesellschaft
- 当前专利权人地址： DE Munich
- 代理机构： Harness, Dickey & Pierce, P.L.C.
- 优先权： DE102006004604 20060201; DE102006004976 20060201; DE102006037282 20060809
- 主分类号： G01N23/04
- IPC分类号： G01N23/04
摘要：
A focus-detector arrangement of an X-ray apparatus is disclosed, for generating projective or tomographic phase contrast recordings of a subject. In at least one embodiment, least one grating of a focus-detector arrangement includes, at least partially, a macroscopically homogeneous medium which, when excited by an energy source, assumes a periodic structure/standing wave field that leads to beam splitting and the formation of an interference pattern when the X-ray beam passes through.