发明授权
US07507608B2 IGBT with amorphous silicon transparent collector 有权
IGBT与非晶硅透明集电极

IGBT with amorphous silicon transparent collector
摘要:
The collector or anode of a non-punch through IGBT formed in a float zone silicon wafer is formed by a P doped amorphous silicon layer deposited on the back surface of an ultra thin wafer. A DMOS structure is formed on the top surface of the wafer before the bottom structure is formed. A back contact is formed over the amorphous silicon layer. No alloy step is needed to activate the anode defined by the P type amorphous silicon.
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