发明授权
- 专利标题: Method for providing uniform removal of organic material
- 专利标题(中): 提供均匀去除有机材料的方法
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申请号: US10877222申请日: 2004-06-25
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公开(公告)号: US07534363B2公开(公告)日: 2009-05-19
- 发明人: Rao V. Annapragada , Odette Turmel , Kenji Takeshita , Lily Zheng , Thomas S. Choi , David R. Pirkle
- 申请人: Rao V. Annapragada , Odette Turmel , Kenji Takeshita , Lily Zheng , Thomas S. Choi , David R. Pirkle
- 申请人地址: US CA Fremont
- 专利权人: Lam Research Corporation
- 当前专利权人: Lam Research Corporation
- 当前专利权人地址: US CA Fremont
- 代理机构: Beyer Law Group LLP
- 主分类号: C23F1/00
- IPC分类号: C23F1/00
摘要:
A method for removing organic material over a substrate is provided. The substrate is placed in a plasma processing chamber. A first gas is provided to an inner zone within the plasma processing chamber. A second gas is provided to an outer zone of the plasma processing chamber, wherein the outer zone surrounds the inner zone and the second gas has a carbon containing component, wherein a concentration of the carbon containing component of the second gas is greater than a concentration of the carbon containing component in the first gas. Plasmas are simultaneously generated from the first gas and second gas. Some or all of the organic material is removed using the generated plasmas.
公开/授权文献
- US20050006346A1 Method for providing uniform removal of organic material 公开/授权日:2005-01-13
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