Invention Grant
US07569780B2 Sensing RF and EM interference of a force-measuring device and adjusting operation accordingly
有权
感测力测量装置的RF和EM干扰,并相应调整操作
- Patent Title: Sensing RF and EM interference of a force-measuring device and adjusting operation accordingly
- Patent Title (中): 感测力测量装置的RF和EM干扰,并相应调整操作
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Application No.: US11927773Application Date: 2007-10-30
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Publication No.: US07569780B2Publication Date: 2009-08-04
- Inventor: Hans-Peter Von Arb , Jean-Christophe Emery , Daniel Reber , Cyrill Bucher , Stefan Buehler , Hansruedi Kuenzi
- Applicant: Hans-Peter Von Arb , Jean-Christophe Emery , Daniel Reber , Cyrill Bucher , Stefan Buehler , Hansruedi Kuenzi
- Applicant Address: CH Greifensee
- Assignee: Mettler-Toledo AG
- Current Assignee: Mettler-Toledo AG
- Current Assignee Address: CH Greifensee
- Agency: Standley Law Group LLP
- Priority: EP06123898 20061111
- Main IPC: G01R29/26
- IPC: G01R29/26 ; G01G23/00 ; H04B17/00 ; G06F3/14

Abstract:
A force-measuring device (100) with at least one housing (20) has an interior space and at least one force-measuring cell (110) installed therein. At least one parameter characterizing an existing high-frequency electromagnetic field is determined by a sensor (50) arranged in the interior space or a sensor arranged outside of the housing, the sensor being adapted for detecting high-frequency electromagnetic fields. After an electromagnetic field is detected and compared to a threshold value, a response action of the force-measuring device is triggered if the detected parameter value exceeds the threshold value.
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