发明授权
US07595490B2 Charged particle beam emitting device and method for operating a charged particle beam emitting device
有权
带电粒子束发射装置和用于操作带电粒子束发射装置的方法
- 专利标题: Charged particle beam emitting device and method for operating a charged particle beam emitting device
- 专利标题(中): 带电粒子束发射装置和用于操作带电粒子束发射装置的方法
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申请号: US11469728申请日: 2006-09-01
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公开(公告)号: US07595490B2公开(公告)日: 2009-09-29
- 发明人: Fang Zhou , Pavel Adamec , Jürgen Frosien , Jimmy Vishnipolsky
- 申请人: Fang Zhou , Pavel Adamec , Jürgen Frosien , Jimmy Vishnipolsky
- 申请人地址: DE Heimstetten
- 专利权人: ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- 当前专利权人: ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- 当前专利权人地址: DE Heimstetten
- 代理机构: Patterson & Sheridan, LLP
- 优先权: EP05019259 20050905
- 主分类号: G01N23/00
- IPC分类号: G01N23/00 ; G21K7/00
摘要:
A method for operating a charged particle beam emitting device and, in particular, an electron beam emitting device including a cold field emitter is provided. The method includes the steps of placing the cold field emitter in a vacuum of a given pressure, the emitter exhibiting a high initial emission current I0 and a lower stable mean emission current IS under a given electric extraction field; applying the given electric extraction field to the emitter for emitting electrons from the emitter surface; performing a cleaning process by applying at least one heating pulse to the cold field emitter for heating the emitter surface, whereby the cleaning process is performed before the emission current of the cold field emitter has declined to the lower stable mean emission value IS; and repeating the cleaning process to keep the emission current of the emitter continuously above the substantially stable emission value IS.
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