发明授权
US07605447B2 Highly manufacturable SRAM cells in substrates with hybrid crystal orientation
有权
具有混合晶体取向的基板中的高度可制造的SRAM单元
- 专利标题: Highly manufacturable SRAM cells in substrates with hybrid crystal orientation
- 专利标题(中): 具有混合晶体取向的基板中的高度可制造的SRAM单元
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申请号: US11162780申请日: 2005-09-22
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公开(公告)号: US07605447B2公开(公告)日: 2009-10-20
- 发明人: Bruce B. Doris , Gregory Costrini , Oleg Gluschenkov , Meikei Ieong , Nakgeuon Seong
- 申请人: Bruce B. Doris , Gregory Costrini , Oleg Gluschenkov , Meikei Ieong , Nakgeuon Seong
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Scully, Scott, Murphy & Preser, P.C.
- 代理商 Joseph P. Abate, Esq.
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L29/04 ; H01L27/11
摘要:
The present invention relates to a semiconductor device structure that includes at least one SRAM cell formed in a substrate. Such SRAM cell comprises two pull-up transistors, two pull-down transistors, and two pass-gate transistors. The pull-down transistors and the pass-gate transistors are substantially similar in channel widths and have substantially similar source-drain doping concentrations, while the SRAM cell has a beta ratio of at least 1.5. The substrate preferably comprises a hybrid substrate with at two isolated sets of regions, while carrier mobility in these two sets of regions differentiates by a factor of at least about 1.5. More preferably, the pull-down transistors of the SRAM cell are formed in one set of regions, and the pass-gate transistors are formed in the other set of regions, so that current flow in the pull-down transistors is larger than that in the pass-gate transistors.
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