发明授权
- 专利标题: Method for forming a capacitor structure
- 专利标题(中): 形成电容器结构的方法
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申请号: US11477581申请日: 2006-06-29
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公开(公告)号: US07615444B2公开(公告)日: 2009-11-10
- 发明人: Odo Wunnicke , Peter Moll , Kristin Schupke
- 申请人: Odo Wunnicke , Peter Moll , Kristin Schupke
- 申请人地址: DE Munich
- 专利权人: Qimonda AG
- 当前专利权人: Qimonda AG
- 当前专利权人地址: DE Munich
- 代理机构: Eschweiler & Associates, LLC
- 主分类号: H01L21/8242
- IPC分类号: H01L21/8242
摘要:
A method for forming a capacitor structure, according to which the following consecutive steps are executed: providing a substrate having on its surface contact pads and a dielectric mold provided with at least one trench leaving exposed the contact pads; forming a first conductive layer on side walls of the trench in a top region of the trench the conductive layer being without contact to the contact pads; depositing a first dielectric layer; depositing a second conductive layer on the contact pad and on the side walls of the trench; depositing a second dielectric layer; depositing a third conductive layer; and forming a vertical plug interconnecting the first conductive layer and the third conductive layer.
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