发明授权
US07763317B2 High K dielectric growth on metal triflate or trifluoroacetate terminated III-V semiconductor surfaces
失效
金属三氟甲磺酸盐或三氟乙酸封端III-V半导体表面上的高K电介质生长
- 专利标题: High K dielectric growth on metal triflate or trifluoroacetate terminated III-V semiconductor surfaces
- 专利标题(中): 金属三氟甲磺酸盐或三氟乙酸封端III-V半导体表面上的高K电介质生长
-
申请号: US11694781申请日: 2007-03-30
-
公开(公告)号: US07763317B2公开(公告)日: 2010-07-27
- 发明人: James M. Blackwell , Willy Rachmady , Gregory J. Kearns , Darryl J. Morrison
- 申请人: James M. Blackwell , Willy Rachmady , Gregory J. Kearns , Darryl J. Morrison
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号: C23C16/00
- IPC分类号: C23C16/00
摘要:
Surface preparation of a compound semiconductor surface, such as indium antimonide (InSb), with a triflating agent, such as triflic anhydride or a trifluoroacetylating agent, such as trifluoroacetic anhydride is described. In one embodiment, the triflating or trifluoroacetylating passivates the compound semiconductor surface by terminating the surface with triflate trifluoroacetate groups. In a further embodiment, a triflating agent or trifluoroacetylating agent is employed to first convert a thin native oxide present on a compound semiconductor surface to a soluble species. In another embodiment, the passivated compound semiconductor surface is activated in an ALD chamber by reacting the triflate or trifluoroacetate protecting groups with a protic source, such as water (H2O). Metalorganic precursors are then introduced in the ALD chamber to form a good quality interfacial layer, such as aluminum oxide (Al2O3), on the compound semiconductor surface.
公开/授权文献
信息查询
IPC分类: