发明授权
- 专利标题: Microcomputer and method of testing the same
- 专利标题(中): 微电脑和测试方法相同
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申请号: US11916702申请日: 2006-06-08
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公开(公告)号: US07793183B2公开(公告)日: 2010-09-07
- 发明人: Toshihiko Yokota , Ken Namura , Mitsuru Sugimoto
- 申请人: Toshihiko Yokota , Ken Namura , Mitsuru Sugimoto
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理商 Yuanmin Cai
- 优先权: JP2005-171268 20050610
- 国际申请: PCT/JP2006/311551 WO 20060608
- 国际公布: WO2006/132329 WO 20061214
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
Embodiments of the present invention provide a microcomputer on which a plurality of ICs (Integrated Circuits) connected from one another by a source-synchronous interface is mounted. The microcomputer includes an IC on the side for transmitting data through the source-synchronous interface which further includes: a PLL (Phase-Locked Loop) circuit being adapted for transmitting an operation clock in actual operation; a first flip-flop being adapted for transmitting test data in accordance with the operation clock transmitted from the PLL circuit; and a second flip-flop being adapted for transmitting a synchronous clock in source-synchronous, in accordance with the operation clock transmitted from the PLL circuit, a synchronous clock in source synchronous, and an IC on the side for receiving data through the source-synchronous interface which further includes a third flip-flop being adapted for capturing, in accordance with the synchronous clock transmitted from the second flip-flop, the test data transmitted from the first flip-flop. Methods for testing the microcomputer are also provided.
公开/授权文献
- US20090119561A1 Microcomputer and Method of Testing The Same 公开/授权日:2009-05-07
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