Microcomputer and Method of Testing The Same
    1.
    发明申请
    Microcomputer and Method of Testing The Same 失效
    微电脑及其测试方法

    公开(公告)号:US20090119561A1

    公开(公告)日:2009-05-07

    申请号:US11916702

    申请日:2006-06-08

    IPC分类号: G01R31/3177 G06F11/25

    摘要: Embodiments of the present invention provide a microcomputer on which a plurality of ICs (Integrated Circuits) connected from one another by a source-synchronous interface is mounted. The microcomputer includes an IC on the side for transmitting data through the source-synchronous interface which further includes: a PLL (Phase-Locked Loop) circuit being adapted for transmitting an operation clock in actual operation; a first flip-flop being adapted for transmitting test data in accordance with the operation clock transmitted from the PLL circuit; and a second flip-flop being adapted for transmitting a synchronous clock in source-synchronous, in accordance with the operation clock transmitted from the PLL circuit, a synchronous clock in source synchronous, and an IC on the side for receiving data through the source-synchronous interface which further includes a third flip-flop being adapted for capturing, in accordance with the synchronous clock transmitted from the second flip-flop, the test data transmitted from the first flip-flop. Methods for testing the microcomputer are also provided.

    摘要翻译: 本发明的实施例提供了一种微型计算机,其上安装有通过源同步接口彼此连接的多个IC(集成电路)。 微型计算机包括:一侧的IC,用于通过源同步接口发送数据,该IC进一步包括:PLL(锁相环)电路,适于在实际操作中发送操作时钟; 第一触发器适于根据从PLL电路发送的操作时钟发送测试数据; 以及第二触发器,其适于根据从PLL电路发送的操作时钟,源同步的同步时钟和用于通过源极同步的接收数据的一侧的IC发送源同步的同步时钟, 同步接口还包括第三触发器,其适于根据从第二触发器发送的同步时钟从第一触发器发送的测试数据进行捕获。 还提供了测试微型计算机的方法。

    Microcomputer and method of testing the same
    2.
    发明授权
    Microcomputer and method of testing the same 失效
    微电脑和测试方法相同

    公开(公告)号:US07793183B2

    公开(公告)日:2010-09-07

    申请号:US11916702

    申请日:2006-06-08

    IPC分类号: G01R31/28

    摘要: Embodiments of the present invention provide a microcomputer on which a plurality of ICs (Integrated Circuits) connected from one another by a source-synchronous interface is mounted. The microcomputer includes an IC on the side for transmitting data through the source-synchronous interface which further includes: a PLL (Phase-Locked Loop) circuit being adapted for transmitting an operation clock in actual operation; a first flip-flop being adapted for transmitting test data in accordance with the operation clock transmitted from the PLL circuit; and a second flip-flop being adapted for transmitting a synchronous clock in source-synchronous, in accordance with the operation clock transmitted from the PLL circuit, a synchronous clock in source synchronous, and an IC on the side for receiving data through the source-synchronous interface which further includes a third flip-flop being adapted for capturing, in accordance with the synchronous clock transmitted from the second flip-flop, the test data transmitted from the first flip-flop. Methods for testing the microcomputer are also provided.

    摘要翻译: 本发明的实施例提供了一种微型计算机,其上安装有通过源同步接口彼此连接的多个IC(集成电路)。 微型计算机包括:一侧的IC,用于通过源同步接口发送数据,该IC进一步包括:PLL(锁相环)电路,适于在实际操作中发送操作时钟; 第一触发器适于根据从PLL电路发送的操作时钟发送测试数据; 以及第二触发器,其适于根据从PLL电路发送的操作时钟,源同步的同步时钟和用于通过源极同步的接收数据的一侧的IC发送源同步的同步时钟, 同步接口还包括第三触发器,其适于根据从第二触发器发送的同步时钟从第一触发器发送的测试数据进行捕获。 还提供了测试微型计算机的方法。

    METHOD AND CIRCUIT FOR LSSD TESTING
    3.
    发明申请
    METHOD AND CIRCUIT FOR LSSD TESTING 失效
    LSSD测试方法与电路

    公开(公告)号:US20070198882A1

    公开(公告)日:2007-08-23

    申请号:US11672072

    申请日:2007-02-07

    IPC分类号: G01R31/28

    摘要: A method and integrated circuit for LSSD testing. The integrated circuit includes a plurality of clock domains supplied with test clocks from separate clock generation circuits. In each clock domain, a scan latch at a clock domain boundary receiving an input from another clock domain includes a master latch for latching an input in response to a first clock, a slave latch for latching an output from the master latch in response to a second clock, a selector for supplying the master latch with a system input when the mode selection signal is at a second level, and a clock control circuit for turning off the first clock when the mode selection signal transits from the first level to the second level.

    摘要翻译: 一种用于LSSD测试的方法和集成电路。 集成电路包括从单独的时钟发生电路提供有测试时钟的多个时钟域。 在每个时钟域中,在接收来自另一时钟域的输入的时钟域边界处的扫描锁存器包括用于响应于第一时钟锁存输入的主锁存器,用于响应于主器件锁存来自主锁存器的输出的从锁存器 第二时钟,当模式选择信号处于第二电平时,用于向主锁存器提供系统输入的选择器;以及当模式选择信号从第一电平转换到第二电平时关闭第一时钟的时钟控制电路 。

    Method and circuit for LSSD testing
    4.
    发明授权
    Method and circuit for LSSD testing 失效
    LSSD测试方法和电路

    公开(公告)号:US07752513B2

    公开(公告)日:2010-07-06

    申请号:US11672072

    申请日:2007-02-07

    IPC分类号: G01R31/28

    摘要: A method and integrated circuit for LSSD testing. The integrated circuit includes a plurality of clock domains supplied with test clocks from separate clock generation circuits. In each clock domain, a scan latch at a clock domain boundary receiving an input from another clock domain includes a master latch for latching an input in response to a first clock, a slave latch for latching an output from the master latch in response to a second clock, a selector for supplying the master latch with a system input when the mode selection signal is at a second level, and a clock control circuit for turning off the first clock when the mode selection signal transits from the first level to the second level.

    摘要翻译: 一种用于LSSD测试的方法和集成电路。 集成电路包括从单独的时钟发生电路提供有测试时钟的多个时钟域。 在每个时钟域中,在接收来自另一时钟域的输入的时钟域边界处的扫描锁存器包括用于响应于第一时钟锁存输入的主锁存器,用于响应于主器件锁存来自主锁存器的输出的从锁存器 第二时钟,当模式选择信号处于第二电平时,用于向主锁存器提供系统输入的选择器;以及当模式选择信号从第一电平转换到第二电平时关闭第一时钟的时钟控制电路 。

    LOGIC TRANSFORMATION AND GATE PLACEMENT TO AVOID ROUTING CONGESTION
    5.
    发明申请
    LOGIC TRANSFORMATION AND GATE PLACEMENT TO AVOID ROUTING CONGESTION 有权
    逻辑转换和栅格放置避免路由约束

    公开(公告)号:US20080115094A1

    公开(公告)日:2008-05-15

    申请号:US12014344

    申请日:2008-01-15

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5045

    摘要: A novel logic design method for avoiding wiring congestion. According to the novel logic design method, an original gate having multiple inputs coming from different directions and having multiple outputs coming to different directions can be transformed to a logic block that has an input stage and an output stage. The gates of the input stage receive signals from the multiple inputs of the original gate. The gates of the output stage send signals to the multiple outputs of the original gate. Each gate of the input stage is placed in a vicinity of its inputs. Each gate of the output stage is placed in a vicinity of its outputs. The gates of the input and output stages are functionally equivalent to the original gate.

    摘要翻译: 一种避免布线堵塞的新颖逻辑设计方法。 根据新颖的逻辑设计方法,可以将具有来自不同方向的多个输入并且具有进入不同方向的多个输出的原始门转换为具有输入级和输出级的逻辑块。 输入级的门从原始门的多个输入接收信号。 输出级的门将信号发送到原始门的多个输出。 输入级的每个门都放置在其输入端附近。 输出级的每个门都放置在其输出端附近。 输入和输出级的门在功能上等同于原始门。

    Logic transformation and gate placement to avoid routing congestion
    6.
    发明授权
    Logic transformation and gate placement to avoid routing congestion 有权
    逻辑转换和门放置,以避免路由拥塞

    公开(公告)号:US08006210B2

    公开(公告)日:2011-08-23

    申请号:US12014344

    申请日:2008-01-15

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5045

    摘要: A novel logic design method for avoiding wiring congestion. According to the novel logic design method, an original gate having multiple inputs coming from different directions and having multiple outputs coming to different directions can be transformed to a logic block that has an input stage and an output stage. The gates of the input stage receive signals from the multiple inputs of the original gate. The gates of the output stage send signals to the multiple outputs of the original gate. Each gate of the input stage is placed in a vicinity of its inputs. Each gate of the output stage is placed in a vicinity of its outputs. The gates of the input and output stages are functionally equivalent to the original gate.

    摘要翻译: 一种避免布线堵塞的新颖逻辑设计方法。 根据新颖的逻辑设计方法,可以将具有来自不同方向的多个输入并且具有进入不同方向的多个输出的原始门转换为具有输入级和输出级的逻辑块。 输入级的门从原始门的多个输入接收信号。 输出级的门将信号发送到原始门的多个输出。 输入级的每个门都放置在其输入端附近。 输出级的每个门都放置在其输出端附近。 输入和输出级的门在功能上等同于原始门。

    CIRCUIT FOR CONTROLLING VOLTAGE FLUCTUATION IN INTEGRATED CIRCUIT
    7.
    发明申请
    CIRCUIT FOR CONTROLLING VOLTAGE FLUCTUATION IN INTEGRATED CIRCUIT 失效
    用于控制集成电路中电压波动的电路

    公开(公告)号:US20080209292A1

    公开(公告)日:2008-08-28

    申请号:US12035536

    申请日:2008-02-22

    申请人: Toshihiko Yokota

    发明人: Toshihiko Yokota

    IPC分类号: G01R31/3187

    CPC分类号: G01R31/318594

    摘要: An integrated circuit and related method for controlling voltage fluctuations. The integrated circuit includes a plurality of clock buffers and a plurality of latches synchronously operated in accordance with operating clock signals distributed via the clock buffers. The circuit comprises a mechanism for performing an At Speed Test to shift data that are initially set for the latches in accordance with the operating clock signals to succeeding latches, respectively. It also has a timing designation circuit for generating a first output signal that is active for a period from a predetermined time, which is after the integrated circuit is powered on and before an operating clock signal for the At Speed Test is generated, to a time when the operating clock signal is generated. In addition, it also includes a current consumption circuit provided in correspondence with each of at least a part of the plurality of clock buffers, for consuming a certain amount of current in the period during which the first output signal is active.

    摘要翻译: 一种用于控制电压波动的集成电路及相关方法。 集成电路包括多个时钟缓冲器和多个锁存器,这些锁存器根据经由时钟缓冲器分配的操作时钟信号同步操作。 该电路包括用于执行At Speed测试以分别将根据操作时钟信号将锁存器初始设置的数据移位到后续锁存器的机构。 它还具有一个时序指定电路,用于产生一个第一输出信号,该第一输出信号在从集成电路上电之后的预定时间起,并且在产生用于速度测试的操作时钟信号之前的一段时间内被激活一段时间 当产生操作时钟信号时。 此外,它还包括与多个时钟缓冲器的至少一部分中的每一个相对应地设置的用于在第一输出信号有效的时段内消耗一定量的电流的电流消耗电路。

    Circuit for controlling voltage fluctuation in integrated circuit
    8.
    发明授权
    Circuit for controlling voltage fluctuation in integrated circuit 失效
    控制集成电路电压波动的电路

    公开(公告)号:US07930608B2

    公开(公告)日:2011-04-19

    申请号:US12035536

    申请日:2008-02-22

    申请人: Toshihiko Yokota

    发明人: Toshihiko Yokota

    IPC分类号: G01R31/28

    CPC分类号: G01R31/318594

    摘要: An integrated circuit for controlling voltage fluctuations. The integrated circuit includes a plurality of clock buffers and latches synchronously operated in accordance with operating clock signals distributed via the clock buffers. The circuit comprises a mechanism for performing an At Speed Test to shift data that are initially set for the latches in accordance with the operating clock signals to succeeding latches, respectively. It also has a timing designation circuit for enabling a clock signal pulse when a first output signal pulse is active. In addition, it includes a ring-type oscillator to consume current in the period during which the first output signal is active. The ring-type oscillator includes a delay control input terminal. The oscillation cycle of the ring-type oscillator is selectively adjusted by adjusting an input of the delay control input terminal.

    摘要翻译: 用于控制电压波动的集成电路。 集成电路包括多个时钟缓冲器和锁存器,它们根据经由时钟缓冲器分配的工作时钟信号同步工作。 该电路包括用于执行At Speed测试以分别将根据操作时钟信号将锁存器初始设置的数据移位到后续锁存器的机构。 它还具有定时指定电路,用于在第一输出信号脉冲有效时启用时钟信号脉冲。 此外,它包括在第一输出信号有效期间消耗电流的环形振荡器。 环型振荡器包括延迟控制输入端。 通过调整延迟控制输入端子的输入来选择性地调整环型振荡器的振荡周期。

    DESIGN STRUCTURE OF AN INTEGRATION CIRCUIT AND TEST METHOD OF THE INTEGRATED CIRCUIT
    9.
    发明申请
    DESIGN STRUCTURE OF AN INTEGRATION CIRCUIT AND TEST METHOD OF THE INTEGRATED CIRCUIT 失效
    集成电路的设计结构和集成电路的测试方法

    公开(公告)号:US20090132973A1

    公开(公告)日:2009-05-21

    申请号:US11942977

    申请日:2007-11-20

    申请人: Toshihiko Yokota

    发明人: Toshihiko Yokota

    IPC分类号: G06F17/50

    摘要: A design structure for an integrated circuit which includes: a first flip-flop which is capable of flushing and which operates by using a first clock signal CLK 1; a second flip-flop DFF 2 which operates by using a second clock signal CLK 2, and which is connected to the first flip flop; and a third flip-flop DFF 3 which operates by using the second clock signal CLK 2, and which is connected to the first flip-flop. A test on a path between the first and second flip-flops is carried out in a manner that test data is released and captured on receipt of the clock signal CLK 2 between the second flip-flop DFF 2 and the third flip-flop DFF 3 via the first flip-flop DFF 1, and that the test data is flushed by the first flip-flop DFF 1.

    摘要翻译: 一种用于集成电路的设计结构,包括:第一触发器,其能够冲洗并通过使用第一时钟信号CLK 1进行操作; 第二触发器DFF2,其通过使用第二时钟信号CLK 2进行操作,并连接到第一触发器; 以及通过使用第二时钟信号CLK 2操作并连接到第一触发器的第三触发器DFF 3。 在第一和第二触发器之间的路径上的测试是以在第二触发器DFF2和第三触发器DFF 3之间的时钟信号CLK 2接收时释放和捕获测试数据的方式进行的 通过第一触发器DFF1,并且测试数据被第一触发器DFF1刷新。

    Logic transformation and gate placement to avoid routing congestion
    10.
    发明申请
    Logic transformation and gate placement to avoid routing congestion 有权
    逻辑转换和门放置,以避免路由拥塞

    公开(公告)号:US20060282809A1

    公开(公告)日:2006-12-14

    申请号:US11153707

    申请日:2005-06-14

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5045

    摘要: A novel logic design method for avoiding wiring congestion. According to the novel logic design method, an original gate having multiple inputs coming from different directions and having multiple outputs coming to different directions can be transformed to a logic block that has an input stage and an output stage. The gates of the input stage receive signals from the multiple inputs of the original gate. The gates of the output stage send signals to the multiple outputs of the original gate. Each gate of the input stage is placed in a vicinity of its inputs. Each gate of the output stage is placed in a vicinity of its outputs. The gates of the input and output stages are functionally equivalent to the original gate.

    摘要翻译: 一种避免布线堵塞的新颖逻辑设计方法。 根据新颖的逻辑设计方法,可以将具有来自不同方向的多个输入并且具有进入不同方向的多个输出的原始门转换为具有输入级和输出级的逻辑块。 输入级的门从原始门的多个输入接收信号。 输出级的门将信号发送到原始门的多个输出。 输入级的每个门都放置在其输入端附近。 输出级的每个门都放置在其输出端附近。 输入和输出级的门在功能上等同于原始门。