发明授权
US07808026B2 Dry etching method and production method of magnetic memory device
有权
磁记忆装置的干蚀刻方法及其制作方法
- 专利标题: Dry etching method and production method of magnetic memory device
- 专利标题(中): 磁记忆装置的干蚀刻方法及其制作方法
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申请号: US12153848申请日: 2008-05-27
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公开(公告)号: US07808026B2公开(公告)日: 2010-10-05
- 发明人: Toshiaki Shiraiwa , Tetsuya Tatsumi , Seiji Samukawa
- 申请人: Toshiaki Shiraiwa , Tetsuya Tatsumi , Seiji Samukawa
- 申请人地址: JP Tokyo JP Miyagi
- 专利权人: Sony Corporation,Seiji Samukawa
- 当前专利权人: Sony Corporation,Seiji Samukawa
- 当前专利权人地址: JP Tokyo JP Miyagi
- 代理机构: Rader, Fishman & Grauer PLLC
- 优先权: JP2003-303410 20030827
- 主分类号: H01L29/76
- IPC分类号: H01L29/76 ; H01L29/94 ; H01L31/062 ; H01L31/113 ; H01L31/119
摘要:
Provision of a process capable of preferably etching particularly PtMn used for a pin layer of an MRAM is an object: a dry etching method for performing dry etching on a layer including platinum and/or manganese by using pulse plasma and a production method of an MRAM, wherein the dry etching method is applied to processing of the pin layer. The MRAM is configured to have a memory portion comprising a magnetic memory element composed of tunnel magnetoresistive effect element formed by stacking a magnetic fixed layer having a fixed magnetization direction, a tunnel barrier layer and a magnetic layer capable of changing the magnetization direction.
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