发明授权
- 专利标题: Testing microchip and testing apparatus using the same
- 专利标题(中): 测试微芯片和使用其的测试仪器
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申请号: US11385525申请日: 2006-03-21
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公开(公告)号: US07811521B2公开(公告)日: 2010-10-12
- 发明人: Yasuhiro Sando , Akihisa Nakajima , Kusunoki Higashino
- 申请人: Yasuhiro Sando , Akihisa Nakajima , Kusunoki Higashino
- 申请人地址: JP Tokyo
- 专利权人: Konica Minolta Medical & Graphic, Inc.
- 当前专利权人: Konica Minolta Medical & Graphic, Inc.
- 当前专利权人地址: JP Tokyo
- 代理机构: Lucas & Mercanti, LLP
- 优先权: JP2005-086682 20050324
- 主分类号: B01L3/02
- IPC分类号: B01L3/02 ; G01N21/00 ; E03B1/00 ; G01N1/10
摘要:
A testing microchip includes a specimen storage section; a reagent storage section; a reaction section; a testing section for a test of a reaction product obtained from the reaction; a liquid feed control section; and a gas bubble trapping structure. The sections are connected continuously by a series of flow channels. The liquid feed control section stops passing of liquid until a liquid feeding pressure reaches a predetermined pressure, and passes the liquid when the liquid feeding pressure becomes higher than the predetermined pressure; and the gas bubble trapping structure traps a gas bubble in the liquid that flows in the flow channel so that the gas bubble does not flow to the downstream side and only the liquid passes to the downstream side. A testing apparatus that performs testing in the testing section of the testing microchip, wherein the testing microchip is attachably and detachably mounted to the apparatus.
公开/授权文献
- US20060216201A1 Testing microchip and testing apparatus using the same 公开/授权日:2006-09-28
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