Invention Grant
- Patent Title: Radiation inspection system
- Patent Title (中): 辐射检测系统
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Application No.: US11997448Application Date: 2007-01-08
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Publication No.: US07817775B2Publication Date: 2010-10-19
- Inventor: Kejun Kang , Haifeng Hu , Zhiqiang Chen , Shangmin Sun , Guang Yang , Fengjun Zhang , Yong Bi , Yucheng Wu , Jianjun Li , Rongxuan Liu
- Applicant: Kejun Kang , Haifeng Hu , Zhiqiang Chen , Shangmin Sun , Guang Yang , Fengjun Zhang , Yong Bi , Yucheng Wu , Jianjun Li , Rongxuan Liu
- Applicant Address: CN Beijing CN Beijing
- Assignee: Tsinghua University,Nuctech Company Limited
- Current Assignee: Tsinghua University,Nuctech Company Limited
- Current Assignee Address: CN Beijing CN Beijing
- Agency: Westman, Champlin & Kelly, P.A.
- Priority: CN200610011148 20060111
- International Application: PCT/CN2007/000066 WO 20070108
- International Announcement: WO2007/079675 WO 20070719
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
Disclosed is an inspection system for inspecting a cargo by using radiation, comprising: a main plate conveyor; a radiation scanning unit that spans said main plate conveyor and is provided above said main plate conveyor, for scanning the cargo provided on the main plate conveyor; auxiliary conveyors that are provided at the front end and rear end of said main plate conveyor, respectively, so as to load the cargo to be inspected onto said main plate conveyor and to unload the inspected cargo from said main plate conveyor; and lifting devices for lifting said auxiliary conveyors. The inspection system according to the present invention occupies less area, has simple corollary equipments, a lower operating cost, and excellent compatibility, and can be widely applied.
Public/Granted literature
- US20080197279A1 Radiation Inspection System Public/Granted day:2008-08-21
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