Invention Grant
- Patent Title: Dynamically reconfigurable shared scan-in test architecture
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Application No.: US12539538Application Date: 2009-08-11
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Publication No.: US07836367B2Publication Date: 2010-11-16
- Inventor: Rohit Kapur , Nodari Sitchinava , Samitha Samaranayake , Emil Gizdarski , Frederic J. Neuveux , Suryanarayana Duggirala , Thomas W. Williams
- Applicant: Rohit Kapur , Nodari Sitchinava , Samitha Samaranayake , Emil Gizdarski , Frederic J. Neuveux , Suryanarayana Duggirala , Thomas W. Williams
- Applicant Address: US CA Mountain View
- Assignee: Synopsys, Inc.
- Current Assignee: Synopsys, Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Bever, Hoffman & Harms, LLP
- Agent Jeanette S. Harms
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.
Public/Granted literature
- US20100031101A1 Dynamically Reconfigurable Shared Scan-In Test Architecture Public/Granted day:2010-02-04
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