公开(公告)号：US20090313514A1

公开(公告)日：2009-12-17

申请号：US12546595

申请日：2009-08-24

Applicant: Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

Inventor： Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

IPC: G01R31/28

CPC classification number: G01R31/318572 ,  G01R31/318536

Abstract: A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.

公开(公告)号：US20090271673A1

公开(公告)日：2009-10-29

申请号：US12500296

申请日：2009-07-09

Applicant: Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

Inventor： Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

IPC: G01R31/3177 ,  G06F11/25

CPC classification number: G01R31/318572 ,  G01R31/318536

Abstract: A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.

Abstract translation: 提供了低开销动态可重配置的共享扫描测试架构。 该测试架构有利地允许在每次移动的扫描操作期间改变扫描输入。 重新配置扫描输入到每个移位周期扫描链映射的灵活性可以有利地减少测试数据量和测试应用时间。

公开(公告)号：US20100223516A1

公开(公告)日：2010-09-02

申请号：US12779018

申请日：2010-05-12

Applicant: Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

Inventor： Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

IPC: G01R31/3177 ,  G06F11/25

CPC classification number: G01R31/318572 ,  G01R31/318536

Abstract: A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.

公开(公告)号：US07774663B2

公开(公告)日：2010-08-10

申请号：US12500296

申请日：2009-07-09

Applicant: Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

Inventor： Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

IPC: G01R31/28

CPC classification number: G01R31/318572 ,  G01R31/318536

Abstract: A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.

公开(公告)号：US07743299B2

公开(公告)日：2010-06-22

申请号：US12178504

申请日：2008-07-23

Applicant: Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

Inventor： Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

IPC: G01R31/28

CPC classification number: G01R31/318572 ,  G01R31/318536

Abstract: A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.

公开(公告)号：US07836368B2

公开(公告)日：2010-11-16

申请号：US12546595

申请日：2009-08-24

Applicant: Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

Inventor： Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

IPC: G01R31/28

CPC classification number: G01R31/318572 ,  G01R31/318536

Abstract: A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.

Abstract translation: 提供了低开销动态可重配置的共享扫描测试架构。 该测试架构有利地允许在每次移动的扫描操作期间改变扫描输入。 重新配置扫描输入到每个移位周期扫描链映射的灵活性可以有利地减少测试数据量和测试应用时间。

公开(公告)号：US07836367B2

公开(公告)日：2010-11-16

申请号：US12539538

申请日：2009-08-11

Applicant: Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

Inventor： Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

IPC: G01R31/28

CPC classification number: G01R31/318572 ,  G01R31/318536

Abstract: A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.

公开(公告)号：US20080301510A1

公开(公告)日：2008-12-04

申请号：US12178517

申请日：2008-07-23

Applicant: Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

Inventor： Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

IPC: G06F11/00

CPC classification number: G01R31/318572 ,  G01R31/318536

Abstract: A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.

公开(公告)号：US07900105B2

公开(公告)日：2011-03-01

申请号：US12779018

申请日：2010-05-12

Applicant: Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

Inventor： Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic J. Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

IPC: G01R31/28

CPC classification number: G01R31/318572 ,  G01R31/318536

Abstract: A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.

Abstract translation: 提供了低开销动态可重配置的共享扫描测试架构。 该测试架构有利地允许在每次移动的扫描操作期间改变扫描输入。 重新配置扫描输入到每个移位周期扫描链映射的灵活性可以有利地减少测试数据量和测试应用时间。

公开(公告)号：US20100031101A1

公开(公告)日：2010-02-04

申请号：US12539538

申请日：2009-08-11

Applicant: Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

Inventor： Rohit Kapur ,  Nodari Sitchinava ,  Samitha Samaranayake ,  Emil Gizdarski ,  Frederic Neuveux ,  Suryanarayana Duggirala ,  Thomas W. Williams

IPC: G01R31/3177 ,  G06F11/25

CPC classification number: G01R31/318572 ,  G01R31/318536

Abstract: A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.

Abstract translation: 提供了低开销动态可重配置的共享扫描测试架构。 该测试架构有利地允许在每次移动的扫描操作期间改变扫描输入。 重新配置扫描输入到每个移位周期扫描链映射的灵活性可以有利地减少测试数据量和测试应用时间。