发明授权
- 专利标题: Fluorine-free precursors and methods for the deposition of conformal conductive films for nanointerconnect seed and fill
- 专利标题(中): 无氟前体和沉积用于纳米互连种子和填充物的共形导电膜的方法
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申请号: US11694677申请日: 2007-03-30
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公开(公告)号: US07858525B2公开(公告)日: 2010-12-28
- 发明人: Juan E. Dominguez , Adrien R. Lavoie , John J. Plombon , Joseph H. Han , Harsono S. Simka , Bryan C. Hendrix , Gregory T. Stauf
- 申请人: Juan E. Dominguez , Adrien R. Lavoie , John J. Plombon , Joseph H. Han , Harsono S. Simka , Bryan C. Hendrix , Gregory T. Stauf
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号: H01L21/44
- IPC分类号: H01L21/44
摘要:
A method including introducing a fluorine-free organometallic precursor in the presence of a substrate; and forming a conductive layer including a moiety of the organometallic precursor on the substrate according to an atomic layer or chemical vapor deposition process. A method including forming an opening through a dielectric layer to a contact point; introducing a fluorine-free copper film precursor and a co-reactant; and forming a copper-containing seed layer in the opening. A system including a computer including a microprocessor electrically coupled to a printed circuit board, the microprocessor including conductive interconnect structures formed from fluorine-free organometallic precursor.
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