- 专利标题: Exposure apparatus, exposure method, and device fabrication method
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申请号: US11407210申请日: 2006-04-20
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公开(公告)号: US07932996B2公开(公告)日: 2011-04-26
- 发明人: Motokatsu Imai , Susumu Makinouchi
- 申请人: Motokatsu Imai , Susumu Makinouchi
- 申请人地址: JP Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff & Berridge, PLC
- 优先权: JPP2003-366914 20031028
- 主分类号: G03B27/52
- IPC分类号: G03B27/52
摘要:
An exposure apparatus forms an immersion area by supplying a liquid onto a part of a substrate, and forms a prescribed pattern on the substrate through the liquid. A spare immersion area, which is capable of holding part of the liquid on the substrate, is formed at the outer circumference of the immersion area. It is possible to prevent the separation of the liquid, which is disposed between a lower surface of a projection optical system and a substrate surface, from the lower surface of the projection optical system in accordance with the relative movement of the projection optical system and the substrate.
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