发明授权
- 专利标题: Lateral diffusion field effect transistor with drain region self-aligned to gate electrode
- 专利标题(中): 侧向扩散场效应晶体管,漏极区自对准至栅电极
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申请号: US12104643申请日: 2008-04-17
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公开(公告)号: US08114750B2公开(公告)日: 2012-02-14
- 发明人: Natalie B. Feilchenfeld , Jeffrey P. Gambino , Xuefeng Liu , Benjamin T. Voegeli , Steven H. Voldman , Michael J. Zierak
- 申请人: Natalie B. Feilchenfeld , Jeffrey P. Gambino , Xuefeng Liu , Benjamin T. Voegeli , Steven H. Voldman , Michael J. Zierak
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Scully, Scott, Murphy & Presser, P.C.
- 代理商 Richard M. Kotulak, Esq.
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
A disposable structure displaced from an edge of a gate electrode and a drain region aligned to the disposable structure is formed. Thus, the drain region is self-aligned to the edge of the gate electrode. The disposable structure may be a disposable spacer, or alternately, the disposable structure may be formed simultaneously with, and comprise the same material as, a gate electrode. After formation of the drain regions, the disposable structure is removed. The self-alignment of the drain region to the edge of the gate electrode provides a substantially constant drift distance that is independent of any overlay variation of lithographic processes.
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