Invention Grant
- Patent Title: Integrated diagnostic test system
- Patent Title (中): 综合诊断测试系统
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Application No.: US10857917Application Date: 2004-06-02
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Publication No.: US08147426B2Publication Date: 2012-04-03
- Inventor: Gary T. Neel , Brent E. Modzelewski , Cameron Scott Casterline
- Applicant: Gary T. Neel , Brent E. Modzelewski , Cameron Scott Casterline
- Applicant Address: US FL Fort Lauderdale
- Assignee: Nipro Diagnostics, Inc.
- Current Assignee: Nipro Diagnostics, Inc.
- Current Assignee Address: US FL Fort Lauderdale
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
- Main IPC: A61B5/00
- IPC: A61B5/00 ; B65D81/00 ; G01N31/00 ; G01N15/06 ; G01N33/00 ; G01N33/48 ; G01N35/00 ; G07F11/66 ; B65H3/00
Abstract:
A system for diagnostic testing may include a meter for performing a diagnostic test on a sample applied to a test media and a container configured to contain test media compatible with the meter. The meter may include a closure portion for selectively closing the opening of the container. The system may also provide mechanisms to disable a power source, an auto-on function of the meter, a diagnostic testing function of the meter, or other function of the meter when it has been determined that a triggering event has occurred. The system may further provide mechanisms to reconfigure the meter to perform a new function when it has been determined that the triggering event has occurred.
Public/Granted literature
- US20050143675A1 Integrated diagnostic test system Public/Granted day:2005-06-30
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