发明授权
- 专利标题： Integrated diagnostic test system
- 专利标题（中）： 综合诊断测试系统
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申请号： US10857917申请日： 2004-06-02
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公开(公告)号： US08147426B2公开(公告)日： 2012-04-03
- 发明人: Gary T. Neel , Brent E. Modzelewski , Cameron Scott Casterline
- 申请人： Gary T. Neel , Brent E. Modzelewski , Cameron Scott Casterline
- 申请人地址： US FL Fort Lauderdale
- 专利权人： Nipro Diagnostics, Inc.
- 当前专利权人： Nipro Diagnostics, Inc.
- 当前专利权人地址： US FL Fort Lauderdale
- 代理机构： Finnegan, Henderson, Farabow, Garrett & Dunner LLP
- 主分类号： A61B5/00
- IPC分类号： A61B5/00 ; B65D81/00 ; G01N31/00 ; G01N15/06 ; G01N33/00 ; G01N33/48 ; G01N35/00 ; G07F11/66 ; B65H3/00
摘要：
A system for diagnostic testing may include a meter for performing a diagnostic test on a sample applied to a test media and a container configured to contain test media compatible with the meter. The meter may include a closure portion for selectively closing the opening of the container. The system may also provide mechanisms to disable a power source, an auto-on function of the meter, a diagnostic testing function of the meter, or other function of the meter when it has been determined that a triggering event has occurred. The system may further provide mechanisms to reconfigure the meter to perform a new function when it has been determined that the triggering event has occurred.
公开/授权文献
- US20050143675A1 Integrated diagnostic test system 公开/授权日：2005-06-30
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