发明授权
US08222650B2 Nitride semiconductor heterostructures and related methods 有权
氮化物半导体异质结构及相关方法

Nitride semiconductor heterostructures and related methods
摘要:
Semiconductor structures and devices based thereon include an aluminum nitride single-crystal substrate and at least one layer epitaxially grown thereover. The epitaxial layer may comprise at least one of AlN, GaN, InN, or any binary or tertiary alloy combination thereof, and have an average dislocation density within the semiconductor heterostructure is less than about 106 cm−2.
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