Invention Grant
- Patent Title: Robust FBEOL and UBM structure of C4 interconnects
- Patent Title (中): C4互连的鲁棒FBEOL和UBM结构
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Application No.: US12560769Application Date: 2009-09-16
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Publication No.: US08227918B2Publication Date: 2012-07-24
- Inventor: Minhua Lu , Eric D. Pefecto , David L. Questad , Sudipta K. Ray
- Applicant: Minhua Lu , Eric D. Pefecto , David L. Questad , Sudipta K. Ray
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: The Law Offices of Robert J. Eichelburg
- Agent Robert J. Eichelburg
- Main IPC: H01L23/48
- IPC: H01L23/48

Abstract:
A microcircuit article of manufacture comprises an electrical conductor electrically connected to both a first microcircuit element at a site comprising a first connector site having a first connector site axis and a second microcircuit element at a site comprising a second connector site having a second connector site axis. The first microcircuit element and the second microcircuit element are separated by and operatively associated with a layer comprising a first electrical insulator, whereas the conductor and the first microcircuit element are separated by and operatively associated with a layer comprising a second electrical insulator. At least one of the first electrical insulator layer and the second electrical insulator layer comprise a polymeric electrical insulator. In another embodiment, both electrical insulator layers comprise polymeric insulator layers. The microcircuit includes a UBM and solder connection to a FBEOL via opening. Sufficiently separating the first connector site axis and the second connector site axis so they are not concentric decouples the UBM and solder connection to the FBEOL via opening to substantially eliminate or minimize inter alia, electromigration and the white bump problem typical of lead free solders employed in C4 systems. A process comprises manufacturing this type of microcircuit article.
Public/Granted literature
- US20110063815A1 Robust FBEOL and UBM Structure of C4 Interconnects Public/Granted day:2011-03-17
Information query
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