Invention Grant
- Patent Title: Self-calibration circuit and method for junction temperature estimation
- Patent Title (中): 自校准电路及结温估算方法
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Application No.: US12971738Application Date: 2010-12-17
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Publication No.: US08348505B2Publication Date: 2013-01-08
- Inventor: Viet Nguyen Hoang , Pascal Bancken , Radu Surdeanu , Benoit Bataillou , David van Steenwinckel
- Applicant: Viet Nguyen Hoang , Pascal Bancken , Radu Surdeanu , Benoit Bataillou , David van Steenwinckel
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP09179980 20091218
- Main IPC: G01K7/00
- IPC: G01K7/00
Abstract:
The present invention relates to a calibration circuit, computer program product, and method of calibrating a junction temperature measurement of a semiconductor element, wherein respective forward voltages at junctions of the semiconductor element and a reference temperature sensor are measured, and an absolute ambient temperature is determined by using the reference temperature sensor, and the junction temperature of the semiconductor element is predicted based on the absolute ambient temperature and the measured forward voltages.
Public/Granted literature
- US20110150028A1 SELF-CALIBRATION CIRCUIT AND METHOD FOR JUNCTION TEMPERATURE ESTIMATION Public/Granted day:2011-06-23
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