发明授权
US08355883B2 Measurement and apparatus for electrical measurement of electrical drive parameters for a MEMS based display
失效
用于基于MEMS的显示器的电驱动参数的电测量的测量和装置
- 专利标题： Measurement and apparatus for electrical measurement of electrical drive parameters for a MEMS based display
- 专利标题（中）： 用于基于MEMS的显示器的电驱动参数的电测量的测量和装置
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申请号： US13526258申请日： 2012-06-18
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公开(公告)号： US08355883B2公开(公告)日： 2013-01-15
- 发明人: Alok Govil , Kostadin Djordjev , Alan Lewis , Wilhelmus Johannes Robertus Van Lier
- 申请人： Alok Govil , Kostadin Djordjev , Alan Lewis , Wilhelmus Johannes Robertus Van Lier
- 申请人地址： US CA San Diego
- 专利权人： QUALCOMM MEMS Technologies, Inc.
- 当前专利权人： QUALCOMM MEMS Technologies, Inc.
- 当前专利权人地址： US CA San Diego
- 代理机构： Knobbe Martens Olson & Bear LLP
- 主分类号： G01R19/00
- IPC分类号： G01R19/00 ; G06F19/00
摘要：
Methods and devices to measure voltage margins of electromechanical devices are disclosed. The voltage margins are determined based on responses to test voltages which cause the devices to change states. State changes of the devices are detected by monitoring integrated current or charge used to drive the devices with the test voltages.