摘要:
Methods and devices to measure voltage margins of electromechanical devices are disclosed. The voltage margins are determined based on responses to test voltages which cause the devices to change states. State changes of the devices are detected by monitoring integrated current or charge used to drive the devices with the test voltages.
摘要:
Methods and devices to measure threshold voltages of MEMS devices are disclosed. The threshold voltages are based on test voltages which cause the devices to change states. State changes of the device are detected by monitoring integrated current or charge used to drive the test voltages.
摘要:
Methods and devices to measure voltage margins of electromechanical devices are disclosed. The voltage margins are determined based on responses to test voltages which cause the devices to change states. State changes of the devices are detected by monitoring integrated current or charge used to drive the devices with the test voltages.
摘要:
Methods and devices to measure voltage margins of electromechanical devices are disclosed. The voltage margins are determined based on responses to test voltages which cause the devices to change states. State changes of the devices are detected by monitoring integrated current or charge used to drive the devices with the test voltages.
摘要:
Methods and devices to measure voltage margins of electromechanical devices are disclosed. The voltage margins are determined based on responses to test voltages which cause the devices to change states. State changes of the devices are detected by monitoring integrated current or charge used to drive the devices with the test voltages.
摘要:
Methods and devices to measure voltage margins of electromechanical devices are disclosed. The voltage margins are determined based on responses to test voltages which cause the devices to change states. State changes of the devices are detected by monitoring integrated current or charge used to drive the devices with the test voltages.
摘要:
Methods and devices to measure threshold voltages of electro-mechanical systems devices are disclosed. The threshold voltages are determined based on which of multiple test voltages cause the devices to change states. State changes of the device are detected by monitoring integrated current or charge used to drive the test voltages.
摘要:
Methods are described for selecting reflective layer distances in an interferometric modulator display that result in reduced color sensitivity to temperature and process variation. Colors are selected for interferometric modulator subpixels that correspond to a minimum in the rate that the colors change with respect to reflective layer distance. In some cases, colors are selected that deviate from the minimums in order to obtain a desired target color (e.g., a desired white point).
摘要:
Charge balanced display data writing methods use write and hold cycles of opposite polarity during selected frame update periods. Spatial dithering of hold cycle signals can reduce flicker.
摘要:
Various embodiments include an interferometric modulator device configured to provide improved saturation. In some embodiments, saturation is improved by optically matching the impedance of two materials with different refractive indices using a multilayer having a refractive index gradient. In various embodiments, the thickness one or more of the layers in the multilayer are selected to provide increased saturation. Accordingly, in various embodiments the multilayer having a refractive index gradient helps to narrow the resonance of a pixel such that the band of wavelengths that are reflected from the pixel is smaller. In turn, a device including a combination of red, green and blue pixels may expand the spectrum of colors that are reflected by the device in operation. Additionally, there may be better contrast between whites and blacks, as darker blacks with less hue are produced.