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    Interferometric modulator displays with reduced color sensitivity
    8.
    发明授权
    Interferometric modulator displays with reduced color sensitivity 失效
    干涉式调制器显示色彩降低

    公开(公告)号：US08111262B2

    公开(公告)日：2012-02-07

    申请号：US11750891

    申请日：2007-05-18

    申请人： Kostadin Djordjev ,  Kasra Khazeni ,  Alok Govil

    发明人： Kostadin Djordjev ,  Kasra Khazeni ,  Alok Govil

    IPC分类号： G09G5/02

    CPC分类号： G02B26/001 ,  G02B27/0012

    摘要： Methods are described for selecting reflective layer distances in an interferometric modulator display that result in reduced color sensitivity to temperature and process variation. Colors are selected for interferometric modulator subpixels that correspond to a minimum in the rate that the colors change with respect to reflective layer distance. In some cases, colors are selected that deviate from the minimums in order to obtain a desired target color (e.g., a desired white point).

    摘要翻译： 描述了用于在干涉式调制器显示器中选择反射层距离的方法，其导致对温度和工艺变化的颜色敏感性降低。 选择对应于颜色相对于反射层距离变化的速率的最小值的干涉式调制器子像素的颜色。 在某些情况下，选择偏离最小值的颜色以获得期望的目标颜色（例如，期望的白点）。

    Methods for characterizing the behavior of microelectromechanical system devices
    9.
    发明授权
    Methods for characterizing the behavior of microelectromechanical system devices 失效
    表征微机电系统设备行为的方法

    公开(公告)号：US08395371B2

    公开(公告)日：2013-03-12

    申请号：US12242790

    申请日：2008-09-30

    申请人： Alok Govil

    发明人： Alok Govil

    IPC分类号： G01R23/02 ,  G01R27/08

    CPC分类号： G01R31/2637 ,  G09G3/006 ,  G09G3/3466 ,  G09G2320/0693

    摘要： Various methods are described to characterize interferometric modulators or similar devices. Measured voltages across interferometric modulators may be used to characterize transition voltages of the interferometric modulators. Measured currents may be analyzed by integration of measured current to provide an indication of a dynamic response of the interferometric modulator. Frequency analysis may be used to provide an indication of a hysteresis window of the interferometric modulator or mechanical properties of the interferometric modulator. Capacitance may be determined through signal correlation, and spread-spectrum analysis may be used to minimize the effect of noise or interference on measurements of various interferometric modulator parameters.

    摘要翻译： 描述了各种方法来表征干涉式调制器或类似装置。 干涉式调制器的测量电压可用于表征干涉式调制器的转换电压。 可以通过积分测量的电流来分析测量的电流，以提供干涉式调制器的动态响应的指示。 可以使用频率分析来提供干涉式调制器的滞后窗口或干涉式调制器的机械特性的指示。 可以通过信号相关来确定电容，并且可以使用扩频分析来最小化噪声或干扰对各种干涉式调制器参数的测量的影响。

    METHOD AND APPARATUS FOR SENSING, MEASUREMENT OR CHARACTERIZATION OF DISPLAY ELEMENTS INTEGRATED WITH THE DISPLAY DRIVE SCHEME, AND SYSTEM AND APPLICATIONS USING THE SAME
    10.
    发明申请
    METHOD AND APPARATUS FOR SENSING, MEASUREMENT OR CHARACTERIZATION OF DISPLAY ELEMENTS INTEGRATED WITH THE DISPLAY DRIVE SCHEME, AND SYSTEM AND APPLICATIONS USING THE SAME 审中-公开
    用于与显示器驱动方案集成的显示元件的感测，测量或表征的方法和装置，以及使用其的系统和应用

    公开(公告)号：US20120212468A1

    公开(公告)日：2012-08-23

    申请号：US13459642

    申请日：2012-04-30

    申请人： Alok Govil

    发明人： Alok Govil

    IPC分类号： G06F3/038

    CPC分类号： G09G3/3466 ,  B81B2201/042 ,  B81C99/003 ,  G09G3/006 ,  G09G2310/066 ,  G09G2320/0295 ,  G09G2320/0693

    摘要： Methods and systems for electrical sensing, measurement and characterization of display elements are described. An embodiment includes integrating the electrical sensing, measurement and characterization with the display drive scheme. This embodiment allows for measurement of DC or operational hysteresis voltages and/or response times of interferometric modulator MEMS devices, for example, to be fully integrated with the display driver IC and/or the display drive scheme. Another embodiment allows these measurements to be performed and used without resulting in display artifacts visible to a human user. Another embodiment allows the measurement circuitry to be integrated with the display driver IC and/or the display drive scheme re-using several existing circuitry components and features, thus allowing for integration of the measurement method and its use relatively easily.

    摘要翻译： 描述了用于显示元件的电感测，测量和表征的方法和系统。 一个实施例包括将电感测，测量和表征与显示驱动方案集成。 该实施例允许测量干涉式调制器MEMS器件的DC或操作滞后电压和/或响应时间，例如与显示器驱动器IC和/或显示器驱动方案完全集成。 另一个实施例允许执行和使用这些测量，而不会导致人类用户可见的显示伪影。 另一个实施例允许测量电路与显示驱动器IC和/或显示驱动方案集成，重新使用几个现有的电路部件和特征，从而允许相对容易地集成测量方法及其使用。