A method to construct first and second configurable systems including: providing a first configurable system including a first die and a second die, where the first die is diced from a first wafer and the second die is diced from a second wafer and the first die is connected to the second die using at least one through-silicon-via (TSV); providing a second configurable system including a third die and a fourth die, where the third die is diced from a third wafer and the fourth die is diced from a fourth wafer and the third die is connected to the fourth die using at least one through-silicon-via (TSV); where processing the first wafer and the third wafer utilizes a majority of masks that are substantially same; and where the first die is larger than the third die.