发明授权
US08384875B2 Exposure apparatus, exposure method, and method for producing device
有权
曝光装置,曝光方法和制造装置的方法
- 专利标题: Exposure apparatus, exposure method, and method for producing device
- 专利标题(中): 曝光装置,曝光方法和制造装置的方法
-
申请号: US12461508申请日: 2009-08-13
-
公开(公告)号: US08384875B2公开(公告)日: 2013-02-26
- 发明人: Yasuhiro Hidaka , Tadashi Nagayama , Tohru Kiuchi
- 申请人: Yasuhiro Hidaka , Tadashi Nagayama , Tohru Kiuchi
- 申请人地址: JP Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff & Berridge, PLC
- 主分类号: G03B27/44
- IPC分类号: G03B27/44 ; G03B27/42 ; G03B27/70 ; G03B27/32 ; G03B27/54 ; G03B27/72
摘要:
An exposure apparatus includes a mask-moving section movable in a first direction while holding a mask formed with a pattern; an illumination system which forms first and second illumination areas separated each other by a spacing distance in the first direction; a substrate-moving section movable in a second direction while holding a photosensitive substrate; a projection optical system which forms first and second projected images of the patterns of the first and second illumination areas; and a restricting section which restricts the first and second projected images to be within first and second projection areas respectively. A spacing distance between a first conjugate area with the first projection area and a second conjugate area with the second projection area is set to be such a spacing distance that scanning exposures are successively performed for first and second transfer areas provided adjacently in the second direction.
公开/授权文献
信息查询