Invention Grant
- Patent Title: Exposure apparatus and method for producing device
- Patent Title (中): 曝光装置及其制造方法
-
Application No.: US11808230Application Date: 2007-06-07
-
Publication No.: US08384877B2Publication Date: 2013-02-26
- Inventor: Naoyuki Kobayashi , Akikazu Tanimoto , Yasushi Mizuno , Kenichi Shiraishi , Katsushi Nakano , Soichi Owa
- Applicant: Naoyuki Kobayashi , Akikazu Tanimoto , Yasushi Mizuno , Kenichi Shiraishi , Katsushi Nakano , Soichi Owa
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2003-146423 20030523; JP2003-305280 20030828; JP2004-049231 20040225
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03B27/52

Abstract:
There is provided an exposure apparatus capable of forming a desirable device pattern by removing unnecessary liquid when performing exposure by projecting a pattern onto the substrate via a projection optical system and the liquid. The exposure device projects an image of the pattern onto the substrate P via the projection optical system and the liquid so as to expose the substrate P. The exposure device includes a liquid removing mechanism 40 which removes the liquid remaining on a part 7 arranged in the vicinity of the image plane of the projection optical system.
Public/Granted literature
- US20080030695A1 Exposure apparatus and method for producing device Public/Granted day:2008-02-07
Information query