发明授权
- 专利标题: Methods of forming a semiconductor device including a metal silicon nitride layer
- 专利标题(中): 形成包括金属氮化硅层的半导体器件的方法
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申请号: US12821924申请日: 2010-06-23
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公开(公告)号: US08389408B2公开(公告)日: 2013-03-05
- 发明人: Young-Lim Park , Jinil Lee , Changsu Kim , Sugwoo Jung
- 申请人: Young-Lim Park , Jinil Lee , Changsu Kim , Sugwoo Jung
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel Sibley & Sajovec, PA
- 优先权: KR10-2009-0059686 20090701
- 主分类号: H01L21/30
- IPC分类号: H01L21/30
摘要:
Provided are methods of forming a semiconductor device. The methods include providing a first precursor and a substitute gas into a reaction chamber having a substrate therein, the first precursor having a first substituent and further providing a second precursor into the reaction chamber. Either the first precursor or the second precursor includes a metal element and the other includes a silicon element, at least one of the first substituents of the first precursor are substituted with the substitute gas, the first precursor substituted with the substitute gas is adsorbed onto the substrate, and the second precursor is reacted with the adsorbed first precursor.
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