Invention Grant
- Patent Title: Process variation detection apparatus and process variation detection method
- Patent Title (中): 过程变异检测装置及过程变异检测方法
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Application No.: US12851547Application Date: 2010-08-05
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Publication No.: US08392132B2Publication Date: 2013-03-05
- Inventor: Ku-Feng Lin , Meng-Fan Chang , Shyh-Shyuan Sheu , Pei-Chia Chiang , Wen-Pin Lin , Chih-He Lin
- Applicant: Ku-Feng Lin , Meng-Fan Chang , Shyh-Shyuan Sheu , Pei-Chia Chiang , Wen-Pin Lin , Chih-He Lin
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Priority: TW99113704A 20100429
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A process variation detection apparatus and a process variation detection method are provided. The process variation detection apparatus includes a process variation detector and a compensation signal generator. The process variation detector includes a first process variation detection component, a second process variation detection component and a current comparator. The channel of the first process variation detection component is a first conductive type, and the channel of the second process variation detection component is a second conductive type, wherein the above-mentioned first conductive type is different from the second conductive type. The current comparator is connected to the first process variation detection component and the second process variation detection component for comparing the current difference between the two components and outputting a current comparison result. The compensation signal generator is connected to the process variation detector, and produces a corresponding compensation signal according to the current comparison result.
Public/Granted literature
- US20110270555A1 PROCESS VARIATION DETECTION APPARATUS AND PROCESS VARIATION DETECTION METHOD Public/Granted day:2011-11-03
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