摘要:
A digital memory element has a sense circuit latch to read the value stored in a bit cell. Before addressing a word line, the bit lines are precharged. During the read operation, a bit line is coupled to a supply voltage through a bit cell memory element that has different resistances at logic states “0” and “1.” A reference bit line is coupled to the supply voltage through a comparison resistance value, especially a resistance between high and low resistance of the memory element in the two logic states. Voltages on the bit line and reference bit line ramp toward a switching threshold at rates related to the resistance values. The first line to discharge to switching threshold voltage sets the sense circuit latch.
摘要:
A 3D-IC detector for each layer of a stacked device comprises a pulse generator to receive an initial signal and generate a pulse-in signal to a next stage detector. A latch is coupled to the pulse generator to receive an output signal from the pulse generator and generate a layer identifying signal. A counter is coupled to previous stage detector and the initial signal to perform a counting operation; and an adder coupled to the counter to add a number to a counting output from the counter and input added signal to the pulse generator.
摘要:
The present invention discloses a control scheme for 3D memory IC that includes a master chip and at least one slave chip. The master chip includes a main memory core, a first local timer, an I/O buffer, a first pad and a second pad. The at least one slave chip is stacked with the master chip. Each of the slave chip includes a slave memory core, a second local timer and a third pad. A first TSV is coupled to the first pad and the third pad. A logic control circuit layer includes a logic control circuit and a fourth pad, and the logic control circuit is coupled to the fourth pad. A second TSV is coupled to the second pad and the fourth pad.
摘要:
A charge pump system for low-supply voltage includes: a clock generator to generate a plurality of clock signals; a clock pump circuit coupled to said clock generator to generate high voltage; a level shifter coupled to said clock generator and said clock pump circuit to generate a plurality of HV (high voltage) clock signals; a main pump circuit coupled to said clock generator and said level shifter to generate output voltage.
摘要:
The present invention discloses a charge pump system for low-supply voltage including: a clock generator to generate a plurality of clock signals; a clock pump circuit coupled to said clock generator to generate high voltage; a level shifter coupled to said clock generator and said clock pump circuit to generate a plurality of HV (high voltage)-clock signals; a main pump circuit coupled to said clock generator and said level shifter to generate output voltage.
摘要:
The present invention relates to a current sensing amplifier and a method thereof. The current sensing amplifier comprises a first current path, a second current path, a first capacitor, a second capacitor and a latch circuit. When a first current and a second current flow in the first current path and the second current path respectively, the first and second capacitor may be charged by the first current and the second current. The first capacitor and the second capacitor may couple the charged voltage to the transistors in the first current path and the second current path when the first and second current path are cut off so as to cancel the effect of offset voltage of the transistors generated during the manufacturing process.
摘要:
A memory refresh system includes a comparative detection circuit, a logic circuit, and a timing circuit. The comparative detection circuit detects a voltage of the storage capacitor of a memory cell of the memory and generates a corresponding digital code by comparing the voltage with a reference voltage. Each memory cell has a corresponding digital code. The combination of the digital codes of the memory cells forms a first state. After a specific period of time, the voltages of the storage capacitors of the memory cells are once detected by the comparative detection circuit, and corresponding digital codes are generated and combined to form a second state. The logic circuit compares the first state and the second state to determining whether or not to change the refresh period of a refresh period detecting process. The timing circuit changes the refresh period according to the determination result of the logic circuit.
摘要:
The invention discloses a NAND type ROM. The NAND type ROM comprises a plurality of bit lines, a plurality of word lines, a first source line, a second source line, and a plurality of NAND strings. The bit lines comprise a plurality of upper bit lines, first lower and second lower bit lines. The first lower and second lower bit lines are alternately arranged in parallel, and the plurality of word lines are vertically arranged to each bit lines. The first and second source line are respectively connected to the plurality of first and second lower bit lines. The plurality of NAND strings comprise a plurality of first and second NAND strings. The first NAND strings are connected to the upper bit lines, word lines, and first lower bit lines. The second NAND strings are connected to the upper bit lines, word lines, and second lower bit lines.
摘要:
A dual mode accessing signal control apparatus for being used in a dummy cells set of a memory, and a dual mode timing signal generating apparatus comprising a dual mode accessing signal control apparatus are provided. The dual mode accessing signal control apparatus respectively generates a write delay signal and a read signal during the write and the read process. The memory is thereby capable of self-timing its write and the read process, and is able to generate a wordline signal with a shorter width in the write process to ensure an early start to precharging. As a result, the whole duty period of the memory can be shortened.
摘要:
The present invention provides a method for eliminating crosstalk (coupling noise) in a metal programmable read only memory. The metal programmable read only memory comprises a plurality of bit lines, a plurality of word lines, a plurality of precharge transistors, and a plurality of clamp transistors. When one of the bit lines is selected, bit lines adjacent to the selected bit line are fixed to a voltage value (VDD, GND or other voltages) by the clamp transistors. The clamping method can not cause voltage drops to the adjacent bit lines, and the crosstalk on the selected bit line can be eliminated simultaneously, so that the problem of read failures caused by the crosstalk in the high-speed metal programmable read only memory can be solved, and a higher speed can be reached.