发明授权
- 专利标题: Profile engineered, electrically active thin film devices
- 专利标题(中): 型材设计,电活性薄膜器件
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申请号: US12243880申请日: 2008-10-01
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公开(公告)号: US08426905B2公开(公告)日: 2013-04-23
- 发明人: Arvind Kamath , Erik Scher , Patrick Smith , Aditi Chandra , Steven Molesa
- 申请人: Arvind Kamath , Erik Scher , Patrick Smith , Aditi Chandra , Steven Molesa
- 申请人地址: US CA San Jose
- 专利权人: Kovio, Inc.
- 当前专利权人: Kovio, Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: The Law Offices of Andrew D. Fortney
- 代理商 Andrew D. Fortney
- 主分类号: H01L29/788
- IPC分类号: H01L29/788
摘要:
The present invention relates to electrically active devices (e.g., capacitors, transistors, diodes, floating gate memory cells, etc.) having dielectric, conductor, and/or semiconductor layers with smooth and/or dome-shaped profiles and methods of forming such devices by depositing or printing (e.g., inkjet printing) an ink composition that includes a semiconductor, metal, or dielectric precursor. The smooth and/or dome-shaped cross-sectional profile allows for smooth topological transitions without sharp steps, preventing feature discontinuities during deposition and allowing for more complete step coverage of subsequently deposited structures. The inventive profile allows for both the uniform growth of oxide layers by thermal oxidation, and substantially uniform etching rates of the structures. Such oxide layers may have a uniform thickness and provide substantially complete coverage of the underlying electrically active feature. Uniform etching allows for an efficient method of reducing a critical dimension of an electrically active structure by simple isotropic etch.
公开/授权文献
- US20090085095A1 Profile Engineered Thin Film Devices and Structures 公开/授权日:2009-04-02
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