发明授权
US08445178B2 Composition for radical polymerization and method of forming pattern using the composition
失效
用于自由基聚合的组合物和使用该组合物形成图案的方法
- 专利标题: Composition for radical polymerization and method of forming pattern using the composition
- 专利标题(中): 用于自由基聚合的组合物和使用该组合物形成图案的方法
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申请号: US12479151申请日: 2009-06-05
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公开(公告)号: US08445178B2公开(公告)日: 2013-05-21
- 发明人: Jong-jin Park , Kwang-hee Lee , Xavier Bulliard , Yun-hyuk Choi , Kwang-sup Lee
- 申请人: Jong-jin Park , Kwang-hee Lee , Xavier Bulliard , Yun-hyuk Choi , Kwang-sup Lee
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Cantor Colburn LLP
- 优先权: KR10-2008-0111862 20081111
- 主分类号: G03F7/00
- IPC分类号: G03F7/00 ; G03F7/004 ; G03F7/40 ; G03F7/027
摘要:
A composition for radical polymerization includes a photosensitive material, a photoinitiator, a solvent, and a material for adjusting a size of a pattern. A method of forming a pattern using the composition is also disclosed.
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