Invention Grant
- Patent Title: Memory layout structure
- Patent Title (中): 内存布局结构
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Application No.: US13343668Application Date: 2012-01-04
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Publication No.: US08471320B2Publication Date: 2013-06-25
- Inventor: Tzung-Han Lee , Chung-Lin Huang , Ron Fu Chu
- Applicant: Tzung-Han Lee , Chung-Lin Huang , Ron Fu Chu
- Applicant Address: TW Hwa-Ya Technology Park Kueishan, Taoyuan
- Assignee: Inotera Memories, Inc.
- Current Assignee: Inotera Memories, Inc.
- Current Assignee Address: TW Hwa-Ya Technology Park Kueishan, Taoyuan
- Agent Winston Hsu; Scott Margo
- Priority: TW100141489A 20111114
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L29/76 ; H01L29/94 ; H01L31/119 ; H01L31/062 ; H01L31/113

Abstract:
A memory array layout includes an active region array having a plurality of active regions, wherein the active regions are arranged alternatively along a second direction and parts of the side of the adjacent active regions are overlapped along a second direction; a plurality of first doped region, wherein each first doped region is disposed in a middle region; a plurality of second doped region, wherein each second doped region is disposed in a distal end region respectively; a plurality of recessed gate structures; a plurality of word lines electrically connected to each recessed gate structure respectively; a plurality of digit lines electrically connected to the first doped region respectively; and a plurality of capacitors electrically connected to each second doped region respectively.
Public/Granted literature
- US20130119448A1 MEMORY LAYOUT STRUCTURE AND MEMORY STRUCTURE Public/Granted day:2013-05-16
Information query
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