Invention Grant
- Patent Title: Systems and methods for monitoring plating and etching baths
- Patent Title (中): 用于监测电镀和蚀刻浴的系统和方法
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Application No.: US11867399Application Date: 2007-10-04
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Publication No.: US08475642B2Publication Date: 2013-07-02
- Inventor: Alan C. West , Mark J. Willey , Robert J. von Gutfeld
- Applicant: Alan C. West , Mark J. Willey , Robert J. von Gutfeld
- Applicant Address: US NY New York
- Assignee: The Trustees of Columbia University in the City of New York
- Current Assignee: The Trustees of Columbia University in the City of New York
- Current Assignee Address: US NY New York
- Agency: Baker Botts LLP
- Main IPC: G01N27/416
- IPC: G01N27/416 ; G01N27/403

Abstract:
Methods and systems for monitoring electrolyte bath fluids are provided. The electrolyte bath fluids can be electroplating, electroless plating or etching solutions. The monitoring systems employ microfluidic devices, which have built in microfluidic channels and microfabricated thin-film electrodes. The devices are configured with fluid pumps to control the movement and mixing of test fluids through the microfluidic channels. The microfabricated thin-film electrodes are configured so that the plating or etching bath fluid composition can be characterized by electrochemical measurements. The monitoring methods and system provide faster measurement times, generate minimal waste, and occupy dramatically reduced physical space compared to conventional bath-monitor systems. The monitoring systems and method also provide low-cost system and methods for measuring or monitoring electroless plating bath rates.
Public/Granted literature
- US20080264801A1 Systems And Methods For Monitoring Plating And Etching Baths Public/Granted day:2008-10-30
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