Invention Grant
US08642973B2 Detection apparatus for detecting charged particles, methods for detecting charged particles and mass spectrometer 有权
用于检测带电粒子的检测装置,用于检测带电粒子的方法和质谱仪

Detection apparatus for detecting charged particles, methods for detecting charged particles and mass spectrometer
Abstract:
Embodiments of the invention provide a detection apparatus for detecting charged particles having a charged particle detector for receiving and detecting either incoming charged particles or secondary charged particles generated from the incoming charged particles, a photon generator for generating photons in response to receiving at least some of the same incoming charged particles or secondary charged particles generated from the incoming charged particles as are received and detected by the charged particle detector, and a photon detector for detecting photons generated by the photon generator.
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