Charged particle analysers and methods of separating charged particles
    1.
    发明授权
    Charged particle analysers and methods of separating charged particles 有权
    带电粒子分析仪和分离带电粒子的方法

    公开(公告)号:US08637815B2

    公开(公告)日:2014-01-28

    申请号:US13375150

    申请日:2010-05-27

    IPC分类号: H01J49/40

    摘要: Methods and analysers useful for time of flight mass spectrometry are provided. A method of separating charged particles comprises the steps of: providing an analyser comprising two opposing mirrors each mirror comprising inner and outer field-defining electrode systems elongated along an axis z, the outer system surrounding the inner and defining therebetween an analyser volume, the mirrors creating an electrical field within the analyser volume comprising opposing electrical fields along z, the strength along z of the electrical field being a minimum at a plane z=0; causing a beam of charged particles to fly through the analyser, orbiting around the z axis within the analyser volume, reflecting from one mirror to the other at least once thereby defining a maximum turning point within a mirror; the strength along z of the electrical field at the maximum turning point being X and the absolute strength along z of the electrical field being less than |X|/2 for not more than ⅔ of the distance along z between the plane z=0 and the maximum turning point in each mirror; separating the charged particles according to their flight times; and ejecting at least some of the charged particles having a plurality of m/z from the analyser or detecting the at least some of charged particles having a plurality of m/z, the ejecting or detecting being performed after the particles have undergone the same number of orbits around the axis z.

    摘要翻译: 提供了可用于飞行时间质谱的方法和分析仪。 分离带电粒子的方法包括以下步骤:提供包括两个相对的反射镜的分析器,每个反射镜包括沿着轴线z细长的内部和外部场限定电极系统,外部系统围绕内部并且在其间限定分析器体积, 在分析器体积内产生包括沿着z的相对电场的电场,在z = 0的平面处电场z的强度是最小的; 使得带电粒子束飞过分析器,围绕分析器体积内的z轴轨道运动,从一个反射镜至另一个反射镜至少一次,从而限定了反射镜内的最大转折点; 在最大转折点处的电场z的强度为X,电场z的绝对强度小于| X | / 2,不超过z = z = 0和每个镜中的最大转折点; 根据飞行时间分离带电粒子; 并且从分析器中排出具有多个m / z的至少一些带电粒子或者检测至少一些具有多个m / z的带电粒子,在粒子经历相同数目之后执行喷射或检测 绕z轴的轨道。

    Charged Particle Analysers and Methods of Separating Charged Particles
    2.
    发明申请
    Charged Particle Analysers and Methods of Separating Charged Particles 有权
    带电粒子分析仪和分离带电粒子的方法

    公开(公告)号:US20120091332A1

    公开(公告)日:2012-04-19

    申请号:US13375187

    申请日:2010-05-27

    IPC分类号: H01J49/40 H01J49/26 H01J49/06

    摘要: A method of separating charged particles using an analyser is provided, the method comprising: causing a beam of charged particles to fly through the analyser and undergo within the analyser at least one full oscillation in the direction of an analyser axis (z) of the analyser whilst orbiting about the axis (z) along a main flight path; constraining the arcuate divergence of the beam as it flies through the analyser; and separating the charged particles according to their flight time. An analyser for performing the method is also provided. At least one arcuate focusing lens is preferably used to constrain the divergence, which may comprise a pair of opposed electrodes located either side of the beam. An array of arcuate focusing lenses may be used which are located at substantially the same z coordinate, the arcuate focusing lenses in the array being spaced apart in the arcuate direction and the array extending at least partially around the z axis, thereby constraining the arcuate divergence of the beam a plurality of times as it flies through the analyser.

    摘要翻译: 提供了一种使用分析器分离带电粒子的方法,所述方法包括:使带电粒子束飞过分析器,并在分析器内沿分析器轴线(z)的方向进行至少一次全部振荡, 同时沿着主飞行路径围绕轴线(z)绕行驶; 约束梁在其穿过分析器时的弓形发散; 并根据飞行时间分离带电粒子。 还提供了用于执行该方法的分析器。 优选地使用至少一个弧形聚焦透镜来限制发散,其可以包括位于光束的任一侧的一对相对的电极。 可以使用位于基本上相同z坐标处的弧形聚焦透镜阵列,阵列中的弧形聚焦透镜在弧形方向上间隔开,并且阵列至少部分地围绕z轴延伸,从而约束弓形散度 的光束多次通过分析仪。

    Detection apparatus for detecting charged particles, methods for detecting charged particles and mass spectrometer
    3.
    发明授权
    Detection apparatus for detecting charged particles, methods for detecting charged particles and mass spectrometer 有权
    用于检测带电粒子的检测装置,用于检测带电粒子的方法和质谱仪

    公开(公告)号:US08680481B2

    公开(公告)日:2014-03-25

    申请号:US12909507

    申请日:2010-10-21

    IPC分类号: H01J49/40 H01J49/02

    摘要: Embodiments of the invention provide a detection apparatus for detecting charged particles having a secondary particle generator for generating secondary charged particles in response to receiving incoming charged particles, a charged particle detector for receiving and detecting secondary charged particles generated by the secondary particle generator, a photon generator for generating photons in response to receiving secondary charged particles generated by the secondary particle generator, and a photon detector for detecting the photons generated by the photon generator.

    摘要翻译: 本发明的实施例提供了一种用于检测带有二次粒子发生器的带电粒子的检测装置,用于响应于接收进入的带电粒子而产生二次带电粒子,用于接收和检测由二次粒子发生器产生的二次带电粒子的带电粒子检测器, 用于响应于由二次粒子发生器产生的接收二次带电粒子而产生光子的发生器,以及用于检测由光子发生器产生的光子的光子检测器。

    Data acquisition system and method for mass spectrometry

    公开(公告)号:US10074528B2

    公开(公告)日:2018-09-11

    申请号:US13994312

    申请日:2011-12-15

    IPC分类号: H01J49/02 H01J49/00

    CPC分类号: H01J49/025 H01J49/0036

    摘要: The invention provides a data acquisition system and method for detecting ions in a mass spectrometer, comprising: a detection system for detecting ions comprising two or more detectors for outputting two or more detection signals in separate channels in response to ions arriving at the detection system; and a data processing system for receiving and processing the detection signals in separate channels of the data processing system and for merging the processed detection signals to construct a mass spectrum; wherein the processing in separate channels comprises removing noise from the detection signals by applying a threshold to the detection signals. The detection signals are preferably produced in response to the same ions, the signals being shifted in time relative to each other. The invention is suitable for a TOF mass spectrometer.

    Charged particle analysers and methods of separating charged particles
    5.
    发明授权
    Charged particle analysers and methods of separating charged particles 有权
    带电粒子分析仪和分离带电粒子的方法

    公开(公告)号:US08658984B2

    公开(公告)日:2014-02-25

    申请号:US13375187

    申请日:2010-05-27

    IPC分类号: H01J3/16

    摘要: A method of separating charged particles using an analyzer is provided, the method comprising: causing a beam of charged particles to fly through the analyzer and undergo within the analyzer at least one full oscillation in the direction of an analyzer axis (z) of the analyzer whilst orbiting about the axis (z) along a main flight path; constraining the arcuate divergence of the beam as it flies through the analyzer; and separating the charged particles according to their flight time. An analyzer for performing the method is also provided. At least one arcuate focusing lens is preferably used to constrain the divergence, which may comprise a pair of opposed electrodes located either side of the beam. An array of arcuate focusing lenses may be used which are located at substantially the same z coordinate, the arcuate focusing lenses in the array being spaced apart in the arcuate direction and the array extending at least partially around the z axis, thereby constraining the arcuate divergence of the beam a plurality of times as it flies through the analyzer.

    摘要翻译: 提供了一种使用分析器分离带电粒子的方法,所述方法包括:使带电粒子束飞过分析器,并在分析器内沿分析器轴线(z)的方向进行至少一次全部振荡, 同时沿着主飞行路径围绕轴线(z)绕行驶; 约束梁在其穿过分析器时的弓形发散; 并根据飞行时间分离带电粒子。 还提供了用于执行该方法的分析器。 优选地使用至少一个弧形聚焦透镜来限制发散,其可以包括位于光束的任一侧的一对相对的电极。 可以使用位于基本上相同z坐标处的弧形聚焦透镜阵列,阵列中的弧形聚焦透镜在弧形方向上间隔开,并且阵列至少部分地围绕z轴延伸,从而约束弓形散度 的光束多次通过分析仪。

    Detection apparatus for detecting charged particles, methods for detecting charged particles and mass spectrometer
    6.
    发明授权
    Detection apparatus for detecting charged particles, methods for detecting charged particles and mass spectrometer 有权
    用于检测带电粒子的检测装置,用于检测带电粒子的方法和质谱仪

    公开(公告)号:US08642973B2

    公开(公告)日:2014-02-04

    申请号:US12909720

    申请日:2010-10-21

    IPC分类号: H01J37/244 H01J49/02

    摘要: Embodiments of the invention provide a detection apparatus for detecting charged particles having a charged particle detector for receiving and detecting either incoming charged particles or secondary charged particles generated from the incoming charged particles, a photon generator for generating photons in response to receiving at least some of the same incoming charged particles or secondary charged particles generated from the incoming charged particles as are received and detected by the charged particle detector, and a photon detector for detecting photons generated by the photon generator.

    摘要翻译: 本发明的实施例提供了一种检测装置,用于检测具有带电粒子检测器的带电粒子的检测装置,用于接收和检测从进入的带电粒子产生的输入带电粒子或二次带电粒子;光子发生器,用于响应于接收至少一些 由带电粒子检测器接收和检测从进入的带电粒子产生的相同的进入带电粒子或二次带电粒子,以及用于检测由光子发生器产生的光子的光子检测器。

    Data Acquisition System and Method for Mass Spectrometry
    7.
    发明申请
    Data Acquisition System and Method for Mass Spectrometry 审中-公开
    数据采集​​系统和质谱法

    公开(公告)号:US20130268212A1

    公开(公告)日:2013-10-10

    申请号:US13994312

    申请日:2011-12-15

    IPC分类号: H01J49/02

    CPC分类号: H01J49/025 H01J49/0036

    摘要: The invention provides a data acquisition system and method for detecting ions in a mass spectrometer, comprising: a detection system for detecting ions comprising two or more detectors for outputting two or more detection signals in separate channels in response to ions arriving at the detection system; and a data processing system for receiving and processing the detection signals in separate channels of the data processing system and for merging the processed detection signals to construct a mass spectrum; wherein the processing in separate channels comprises removing noise from the detection signals by applying a threshold to the detection signals. The detection signals are preferably produced in response to the same ions, the signals being shifted in time relative to each other. The invention is suitable for a TOF mass spectrometer.

    摘要翻译: 本发明提供了一种用于检测质谱仪中的离子的数据采集系统和方法,包括:用于检测包括两个或更多个检测器的离子的检测系统,用于响应于到达检测系统的离子在单独的通道中输出两个或更多个检测信号; 以及数据处理系统,用于在数据处理系统的单独信道中接收和处理检测信号,并且用于合并处理的检测信号以构建质谱; 其中在单独信道中的处理包括通过对检测信号应用阈值来从检测信号中去除噪声。 优选地,响应于相同的离子产生检测信号,信号在时间上相对于彼此移动。 本发明适用于TOF质谱仪。

    Charged Particle Analysers And Methods Of Separating Charged Particles
    8.
    发明申请
    Charged Particle Analysers And Methods Of Separating Charged Particles 有权
    带电粒子分析仪和分离带电粒子的方法

    公开(公告)号:US20120138785A1

    公开(公告)日:2012-06-07

    申请号:US13375150

    申请日:2010-05-27

    IPC分类号: H01J49/40 H01J49/26

    摘要: Methods and analysers useful for time of flight mass spectrometry are provided. A method of separating charged particles comprises the steps of: providing an analyser comprising two opposing mirrors each mirror comprising inner and outer field-defining electrode systems elongated along an axis z, the outer system surrounding the inner and defining therebetween an analyser volume, the mirrors creating an electrical field within the analyser volume comprising opposing electrical fields along z, the strength along z of the electrical field being a minimum at a plane z=0; causing a beam of charged particles to fly through the analyser, orbiting around the z axis within the analyser volume, reflecting from one mirror to the other at least once thereby defining a maximum turning point within a mirror; the strength along z of the electrical field at the maximum turning point being X and the absolute strength along z of the electrical field being less than |X|/2 for not more than ⅔ of the distance along z between the plane z=0 and the maximum turning point in each mirror; separating the charged particles according to their flight times; and ejecting at least some of the charged particles having a plurality of m/z from the analyser or detecting the at least some of charged particles having a plurality of m/z, the ejecting or detecting being performed after the particles have undergone the same number of orbits around the axis z.

    摘要翻译: 提供了可用于飞行时间质谱的方法和分析仪。 分离带电粒子的方法包括以下步骤:提供包括两个相对的反射镜的分析器,每个反射镜包括沿着轴线z细长的内部和外部场限定电极系统,外部系统围绕内部并且在其间限定分析器体积, 在分析器体积内产生包括沿着z的相对电场的电场,在z = 0的平面处电场z的强度是最小的; 使得带电粒子束飞过分析器,围绕分析器体积内的z轴轨道运动,从一个反射镜至另一个反射镜至少一次,从而限定了反射镜内的最大转折点; 在最大转折点处的电场z的强度为X,电场z的绝对强度小于| X | / 2,不超过z = 0和 每个镜子的最大转折点; 根据飞行时间分离带电粒子; 并且从分析器中排出具有多个m / z的至少一些带电粒子或者检测至少一些具有多个m / z的带电粒子,在粒子经历相同数目之后执行喷射或检测 绕z轴的轨道。

    Multiple Ion Isolation in Multi-Reflection Systems
    9.
    发明申请
    Multiple Ion Isolation in Multi-Reflection Systems 有权
    多反射系统中的多离子隔离

    公开(公告)号:US20100059673A1

    公开(公告)日:2010-03-11

    申请号:US12514683

    申请日:2007-11-14

    IPC分类号: H01J49/26 H01J49/06 H01J49/40

    CPC分类号: H01J49/0081 H01J49/0031

    摘要: This invention relates to a method of operating a charged particle trap in which ions undergo multiple reflections back and forth and/or follow a closed orbit around, usually, a set of electrodes. The invention allows high-performance isolation of multiple ion species for subsequent detection or fragmentation by deflecting ions out of the ion trap according to a timing scheme calculated with reference to the ions' periods of oscillation within the ion trap.

    摘要翻译: 本发明涉及一种操作带电粒子捕集器的方法,其中离子通常在一组电极周围进行多次反射和/或跟随闭合轨道。 本发明允许通过根据离子陷阱内的离子振荡周期计算的定时方案将离子偏离离子阱,从而高效隔离多个离子物质用于随后的检测或碎裂。

    Time of flight mass spectrometry apparatus
    10.
    发明授权
    Time of flight mass spectrometry apparatus 失效
    飞行时间质谱仪

    公开(公告)号:US07075065B2

    公开(公告)日:2006-07-11

    申请号:US10925192

    申请日:2004-08-24

    IPC分类号: H01L49/40

    CPC分类号: H01J49/405 H01J49/004

    摘要: Mass spectrometry apparatus 105 comprises a serial arrangement of an ion source 110, first time of flight means, a field free region 120, means to fragment the molecules, a second time of flight means and a large area detector 160. The second time of flight means includes an ion mirror 150, the ion mirror 150 being arranged to produce a reflecting substantially quadratic field. The first time of flight means is arranged to provide spatial focusing concomitant with time focusing of ions at or near the entrance to the ion mirror 150. The means provided to fragment the ions front the first time of flight means can be a collision cell 140 or in the field free region 220 or in the first time of flight means. The means to fragment the molecules has a potential which is different from the potential at the entrance to the ion mirror 150, and the detecting surface of the detector 160 is mounted in the time focal surface of the ion mirror 150.

    摘要翻译: 质谱装置105包括离子源110的串行排列,第一飞行时间装置,无场区域120,分解分子的装置,第二时间飞行装置和大面积检测器160。 第二次飞行装置包括离子镜150,离子镜150被布置成产生反射基本上二次场。 第一次飞行装置被设置成提供空间聚焦,伴随着离子在离子反射镜150的入口处或附近的时间聚焦。 提供用于在飞行装置的第一时间前面分离离子的装置可以是碰撞室140或场自由区域220或在第一次飞行装置中。 分解分子的方法具有与入射到离子镜150的电位不同的电位,并且检测器160的检测表面安装在离子反射镜150的时间焦点表面中。