发明授权
- 专利标题: Method of manufacturing GaN-based film
- 专利标题(中): 制造GaN基膜的方法
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申请号: US13643206申请日: 2011-11-10
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公开(公告)号: US08697550B2公开(公告)日: 2014-04-15
- 发明人: Issei Satoh , Yuki Seki , Koji Uematsu , Yoshiyuki Yamamoto , Hideki Matsubara , Shinsuke Fujiwara , Masashi Yoshimura
- 申请人: Issei Satoh , Yuki Seki , Koji Uematsu , Yoshiyuki Yamamoto , Hideki Matsubara , Shinsuke Fujiwara , Masashi Yoshimura
- 申请人地址: JP Osaka-shi, Osaka
- 专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人地址: JP Osaka-shi, Osaka
- 代理机构: Drinker Biddle & Reath LLP
- 优先权: JP2010-254529 20101115; JP2010-255840 20101116; JP2011-230682 20111020
- 国际申请: PCT/JP2011/075961 WO 20111110
- 国际公布: WO2012/067015 WO 20120524
- 主分类号: H01L21/20
- IPC分类号: H01L21/20
摘要:
The present method of manufacturing a GaN-based film includes the steps of preparing a composite substrate, the composite substrate including a support substrate in which a coefficient of thermal expansion in a main surface is more than 0.8 time and less than 1.2 times as high as a coefficient of thermal expansion of GaN crystal in a direction of a axis and a single crystal film arranged on a side of the main surface of the support substrate, the single crystal film having threefold symmetry with respect to an axis perpendicular to a main surface of the single crystal film, and forming a GaN-based film on the main surface of the single crystal film in the composite substrate. Thus, a method of manufacturing a GaN-based film capable of manufacturing a GaN-based film having a large main surface area and less warpage is provided.
公开/授权文献
- US08658517B2 Method of manufacturing GaN-based film 公开/授权日:2014-02-25
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