Invention Grant
- Patent Title: Measuring apparatus for measuring a physical property of a sample
- Patent Title (中): 用于测量样品的物理性质的测量装置
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Application No.: US13167585Application Date: 2011-06-23
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Publication No.: US08712702B2Publication Date: 2014-04-29
- Inventor: Takeshi Takagi , Koji Okumura , Tatsuo Kamata
- Applicant: Takeshi Takagi , Koji Okumura , Tatsuo Kamata
- Applicant Address: JP Kyoto
- Assignee: ARKRAY, Inc.
- Current Assignee: ARKRAY, Inc.
- Current Assignee Address: JP Kyoto
- Agency: Studebaker & Brackett PC
- Priority: JP2010-142244 20100623; JP2011-137934 20110622
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G01N1/10

Abstract:
A measuring apparatus for measuring a predetermined physical property of a liquid measuring sample comprises a preparing unit in which a plurality of materials including at least a liquid material are mixed; a supply route which supplies the liquid material to the preparing unit; a withdrawing unit which withdraws the measuring sample from the preparing unit into the supply route, the measuring sample being prepared to contain the liquid material supplied to the preparing unit via the supply route; and a measuring unit which measures the predetermined physical property of the measuring sample withdrawn into the supply route by the withdrawing unit.
Public/Granted literature
- US20120158314A1 MEASURING APPARATUS FOR MEASURING A PHYSICAL PROPERTY OF A SAMPLE Public/Granted day:2012-06-21
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